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A1356LKBTN-T PDF预览

A1356LKBTN-T

更新时间: 2024-11-15 01:13:51
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急速微 - ALLEGRO /
页数 文件大小 规格书
20页 438K
描述
High Precision Linear Hall-Effect Sensor IC High Precision Linear Hall-Effect Sensor IC

A1356LKBTN-T 数据手册

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A1356  
High Precision Linear Hall-Effect Sensor IC  
With an Open Drain Pulse Width Modulated Output  
Features and Benefits  
Description  
Simultaneous programming of PWM carrier frequency,  
quiescent duty cycle, and sensitivity; for system  
optimization  
The A1356 device is a high precision, programmable open  
drainHall-effectlinearsensorICwithapulsewidthmodulated  
(PWM) output. The duty cycle (D) of the PWM output signal  
is proportional to an applied magnetic field. TheA1356 device  
converts an analog signal from its internal Hall element to  
a digitally encoded PWM output signal. The coupled noise  
immunity of the digitally encoded PWM output is far superior  
to the noise immunity of an analog output signal.  
Factory programmed sensitivity temperature coefficient  
and quiescent duty cycle drift  
Programmability at end-of-line  
Pulse width modulated (PWM) output provides increased  
noise immunity compared to an analog output  
Precise recoverability after temperature cycling  
• Output duty cycle clamps provide short circuit diagnostic  
capabilities  
Optional 50% duty cycle calibration test mode at device  
power up  
Wide ambient temperature range: –40°C to 150°C  
Resistant to mechanical stress  
Advanced chopper stabilization circuits and differential  
signal path design lead to very low output offset levels  
Proprietary on-chip filters provide high output resolution  
Wide power supply operating range: 4.5 to 18 V  
TheBiCMOS,monolithiccircuitinsideoftheA1356integrates  
a Hall element, precision temperature-compensating circuitry  
to reduce the intrinsic sensitivity and offset drift of the Hall  
element, a small-signal high-gain amplifier, proprietary  
dynamic offset cancellation circuits, and PWM conversion  
circuitry. The dynamic offset cancellation circuits reduce  
the residual offset voltage of the Hall element. Hall element  
offset is normally caused by device overmolding, temperature  
dependencies, and thermal stress. The high frequency offset  
cancellation (chopping) clock allows for a greater sampling  
rate, which increases the accuracy of the output signal and  
results in faster signal processing capability.  
Package: 3-pin SIP (suffix KB)  
The A1356 sensor is provided in a lead (Pb) free 3-pin single  
inline package (KB suffix), with 100% matte tin leadframe  
plating.  
Not to scale  
Functional Block Diagram  
PWM Carrier  
Generation  
VCC/  
Programming  
Regulator  
PWM  
Frequency Trim  
1
2
2
1
Signal  
Conditioning  
PWMOUT  
Signal  
Recovery  
Chopper  
Switches  
Amp  
% Duty  
Cycle  
Sensitivity  
Trim  
Temperature  
Compensation  
% Duty Cycle  
Temperature  
Coefficient  
GND  
A1356-DS  

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