74LVC1G00-Q100
Single 2-input NAND gate
Rev. 3 — 7 February 2019
Product data sheet
1. General description
The 74LVC1G00-Q100 provides the single 2-input NAND function.
Input can be driven from either 3.3 V or 5 V devices. These features allow the use of these devices
in a mixed 3.3 V and 5 V environment.
Schmitt trigger action at all inputs makes the circuit tolerant for slower input rise and fall time.
This device is fully specified for partial power-down applications using IOFF. The IOFF circuitry
disables the output, preventing the damaging backflow current through the device when it is
powered down.
This product has been qualified to the Automotive Electronics Council (AEC) standard Q100
(Grade 1) and is suitable for use in automotive applications.
2. Features and benefits
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Automotive product qualification in accordance with AEC-Q100 (Grade 1)
Specified from -40 °C to +85 °C and from -40 °C to +125 °C
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Wide supply voltage range from 1.65 V to 5.5 V
High noise immunity
Complies with JEDEC standard:
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JESD8-7 (1.65 V to 1.95 V)
JESD8-5 (2.3 V to 2.7 V)
JESD8-B/JESD36 (2.7 V to 3.6 V)
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±24 mA output drive (VCC = 3.0 V)
CMOS low power consumption
Latch-up performance exceeds 250 mA
Direct interface with TTL levels
Inputs accept voltages up to 5 V
ESD protection:
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MIL-STD-883, method 3015 exceeds 2000 V
HBM JESD22-A114F exceeds 2000 V
MM JESD22-A115-A exceeds 200 V (C = 200 pF, R = 0 Ω)
3. Ordering information
Table 1. Ordering information
Type number
Package
Temperature range
Name
Description
Version
74LVC1G00GW-Q100 -40 °C to +125 °C
TSSOP5
plastic thin shrink small outline package;
5 leads; body width 1.25 mm
SOT353-1
74LVC1G00GV-Q100 -40 °C to +125 °C
SC-74A
plastic surface-mounted package; 5 leads
SOT753