IDT7025S/L
High-Speed 8K x 16 Dual-Port Static RAM
Military, Industrial and Commercial Temperature Ranges
AC Electrical Characteristics Over the
OperatingTemperatureandSupplyVoltageRange(4)
7025X15
7025X17
7025X20
Com'l, Ind
& Military
7025X25
Com'l &
Military
Com'l Only
Com'l Only
Symbol
Parameter
Min.
Max.
Min.
Max.
Min.
Max.
Min.
Max.
Unit
READ CYCLE
____
____
____
____
tRC
tAA
Read Cycle Time
15
17
20
25
ns
ns
ns
____
____
____
____
Address Access Time
15
15
15
17
17
17
20
20
20
25
25
25
____
____
____
____
____
____
____
____
____
____
____
____
Chip Enable Access Time(3)
Byte Enable Access Time(3)
tACE
tABE
tAOE
tOH
tLZ
ns
ns
ns
ns
ns
ns
ns
ns
Output Enable Access Time(3)
Output Hold from Address Change
Output Low-Z Time(1,2)
10
10
12
13
____
____
____
____
3
3
3
3
____
____
____
____
3
3
3
3
____
____
____
____
Output High-Z Time(1,2)
tHZ
10
10
12
15
____
____
____
____
Chip Enable to Power Up Time(1,2)
tPU
tPD
tSOP
tSAA
0
0
0
0
____
____
____
____
Chip Disable to Power Down Time(1,2)
Semaphore Flag Update Pulse (OE or SEM)
Semaphore Address Access(3)
15
17
20
25
____
____
____
____
10
10
10
10
____
____
____
____
15
17
20
25
ns
2683 tbl 12a
7025X35
Com'l &
Military
7025X55
Com'l, Ind
& Military
7025X70
Military Only
Symbol
Parameter
Min.
Max.
Min.
Max.
Min.
Max.
Unit
READ CYCLE
____
____
____
t
RC
AA
ACE
ABE
AOE
OH
LZ
HZ
PU
PD
SOP
SAA
Read Cycle Time
35
55
70
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
____
____
____
t
Address Access Time
35
35
35
55
55
55
70
70
70
Chip Enable Access Time(3)
Byte Enable Access Time(3)
Output Enable Access Time(3)
Output Hold from Address Change
Output Low-Z Time(1,2)
____
____
____
____
____
____
____
____
____
t
t
t
20
30
35
____
____
____
t
3
3
3
____
____
____
t
3
3
3
Output High-Z Time(1,2)
15
25
30
____
____
____
t
t
Chip Enable to Power Up Time(1,2)
Chip Disable to Power Down Time(1,2)
Semaphore Flag Update Pulse (OE or SEM)
Semaphore Address Access(3)
0
0
0
____
____
____
____
____
____
t
35
50
50
____
____
____
t
15
15
15
____
____
____
t
35
55
70
ns
2683 tbl 12b
NOTES:
1. Transition is measured 0mV from Low or High-impedance voltage with Output Test Load (Figure 2).
2. This parameter is guaranteed by device characterazation, but is not production tested.
3. To access RAM, CE = VIL, UB or LB = VIL, and SEM = VIH. To access semephore, CE = VIH or UB & LB = VIH, and SEM = VIL.
4. 'X' in part number indicates power rating (S or L).
6.42
9