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54F323DMQB PDF预览

54F323DMQB

更新时间: 2024-02-14 11:50:27
品牌 Logo 应用领域
德州仪器 - TI 输出元件逻辑集成电路触发器
页数 文件大小 规格书
6页 18K
描述
F/FAST SERIES, 8-BIT BIDIRECTIONAL PARALLEL IN PARALLEL OUT SHIFT REGISTER, TRUE OUTPUT, CDIP20

54F323DMQB 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
包装说明:DIP, DIP20,.3Reach Compliance Code:unknown
HTS代码:8542.39.00.01风险等级:5.49
其他特性:HOLD MODE; COMMON I/O PINS计数方向:BIDIRECTIONAL
系列:F/FASTJESD-30 代码:R-GDIP-T20
JESD-609代码:e0长度:24.51 mm
逻辑集成电路类型:PARALLEL IN PARALLEL OUT位数:8
功能数量:1端子数量:20
最高工作温度:125 °C最低工作温度:-55 °C
输出特性:3-STATE输出极性:TRUE
封装主体材料:CERAMIC, GLASS-SEALED封装代码:DIP
封装等效代码:DIP20,.3封装形状:RECTANGULAR
封装形式:IN-LINE峰值回流温度(摄氏度):NOT SPECIFIED
电源:5 V传播延迟(tpd):10 ns
认证状态:Not Qualified筛选级别:38535Q/M;38534H;883B
座面最大高度:5.08 mm子类别:Shift Registers
最大供电电压 (Vsup):5.5 V最小供电电压 (Vsup):4.5 V
标称供电电压 (Vsup):5 V表面贴装:NO
技术:TTL温度等级:MILITARY
端子面层:Tin/Lead (Sn/Pb)端子形式:THROUGH-HOLE
端子节距:2.54 mm端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED触发器类型:POSITIVE EDGE
宽度:7.62 mm最小 fmax:100 MHz

54F323DMQB 数据手册

 浏览型号54F323DMQB的Datasheet PDF文件第2页浏览型号54F323DMQB的Datasheet PDF文件第3页浏览型号54F323DMQB的Datasheet PDF文件第4页浏览型号54F323DMQB的Datasheet PDF文件第5页浏览型号54F323DMQB的Datasheet PDF文件第6页 
MILITARY DATA SHEET  
Original Creation Date: 04/25/96  
Last Update Date: 07/30/96  
MN54F323-X REV 1A0  
Last Major Revision Date: 04/25/96  
OCTAL UNIVERSAL SHIFT/STORAGE REGISTER WITH  
SYNCHRONOUS RESET AND COMMON I/O PINS  
General Description  
The F323 is an 8-bit universal shift/storage register with TRI-STATE outputs. Its  
function is similar to the F299 with the exception of Syncronous Reset. Parallel load  
inputs and flip-flop outputs are multiplexed to minimize pin count. Separate serial  
inputs and outputs are provided for Q0 and Q7 to allow easy cascading. Four operation  
modes are possible: hold (store), shift left, shift right and parallel load.  
Industry Part Number  
NS Part Numbers  
54F323  
54F323DMQB  
54F323FMQB  
54F323LMQB  
Prime Die  
M323  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1

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