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54F323LMQB PDF预览

54F323LMQB

更新时间: 2024-02-06 20:44:39
品牌 Logo 应用领域
德州仪器 - TI 输出元件逻辑集成电路触发器
页数 文件大小 规格书
6页 18K
描述
F/FAST SERIES, 8-BIT BIDIRECTIONAL PARALLEL IN PARALLEL OUT SHIFT REGISTER, TRUE OUTPUT, CQCC20

54F323LMQB 技术参数

生命周期:Obsolete包装说明:QCCN, LCC20,.35SQ
Reach Compliance Code:unknownHTS代码:8542.39.00.01
风险等级:5.73其他特性:HOLD MODE; COMMON I/O PINS
计数方向:BIDIRECTIONAL系列:F/FAST
JESD-30 代码:S-CQCC-N20长度:8.89 mm
逻辑集成电路类型:PARALLEL IN PARALLEL OUT位数:8
功能数量:1端子数量:20
最高工作温度:125 °C最低工作温度:-55 °C
输出特性:3-STATE输出极性:TRUE
封装主体材料:CERAMIC, METAL-SEALED COFIRED封装代码:QCCN
封装等效代码:LCC20,.35SQ封装形状:SQUARE
封装形式:CHIP CARRIER电源:5 V
传播延迟(tpd):10 ns认证状态:Not Qualified
筛选级别:38535Q/M;38534H;883B座面最大高度:1.905 mm
子类别:Shift Registers最大供电电压 (Vsup):5.5 V
最小供电电压 (Vsup):4.5 V标称供电电压 (Vsup):5 V
表面贴装:YES技术:TTL
温度等级:MILITARY端子形式:NO LEAD
端子节距:1.27 mm端子位置:QUAD
触发器类型:POSITIVE EDGE宽度:8.89 mm
最小 fmax:100 MHzBase Number Matches:1

54F323LMQB 数据手册

 浏览型号54F323LMQB的Datasheet PDF文件第2页浏览型号54F323LMQB的Datasheet PDF文件第3页浏览型号54F323LMQB的Datasheet PDF文件第4页浏览型号54F323LMQB的Datasheet PDF文件第5页浏览型号54F323LMQB的Datasheet PDF文件第6页 
MILITARY DATA SHEET  
Original Creation Date: 04/25/96  
Last Update Date: 07/30/96  
MN54F323-X REV 1A0  
Last Major Revision Date: 04/25/96  
OCTAL UNIVERSAL SHIFT/STORAGE REGISTER WITH  
SYNCHRONOUS RESET AND COMMON I/O PINS  
General Description  
The F323 is an 8-bit universal shift/storage register with TRI-STATE outputs. Its  
function is similar to the F299 with the exception of Syncronous Reset. Parallel load  
inputs and flip-flop outputs are multiplexed to minimize pin count. Separate serial  
inputs and outputs are provided for Q0 and Q7 to allow easy cascading. Four operation  
modes are possible: hold (store), shift left, shift right and parallel load.  
Industry Part Number  
NS Part Numbers  
54F323  
54F323DMQB  
54F323FMQB  
54F323LMQB  
Prime Die  
M323  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1

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