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2SC5197-R PDF预览

2SC5197-R

更新时间: 2024-11-23 21:09:43
品牌 Logo 应用领域
东芝 - TOSHIBA 局域网放大器晶体管
页数 文件大小 规格书
4页 140K
描述
TRANSISTOR 8 A, 120 V, NPN, Si, POWER TRANSISTOR, 2-16C1A, 3 PIN, BIP General Purpose Power

2SC5197-R 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
包装说明:FLANGE MOUNT, R-PSFM-T3针数:3
Reach Compliance Code:unknownECCN代码:EAR99
风险等级:5.81外壳连接:COLLECTOR
最大集电极电流 (IC):8 A集电极-发射极最大电压:120 V
配置:SINGLE最小直流电流增益 (hFE):55
JESD-30 代码:R-PSFM-T3元件数量:1
端子数量:3最高工作温度:150 °C
封装主体材料:PLASTIC/EPOXY封装形状:RECTANGULAR
封装形式:FLANGE MOUNT峰值回流温度(摄氏度):NOT SPECIFIED
极性/信道类型:NPN功耗环境最大值:80 W
最大功率耗散 (Abs):80 W认证状态:Not Qualified
子类别:Other Transistors表面贴装:NO
端子形式:THROUGH-HOLE端子位置:SINGLE
处于峰值回流温度下的最长时间:NOT SPECIFIED晶体管应用:AMPLIFIER
晶体管元件材料:SILICON标称过渡频率 (fT):30 MHz
VCEsat-Max:2 VBase Number Matches:1

2SC5197-R 数据手册

 浏览型号2SC5197-R的Datasheet PDF文件第2页浏览型号2SC5197-R的Datasheet PDF文件第3页浏览型号2SC5197-R的Datasheet PDF文件第4页 
2SC5197  
TOSHIBA Transistor Silicon NPN Triple Diffused Type  
2SC5197  
Power Amplifier Applications  
Unit: mm  
Complementary to 2SA1940  
Suitable for use in 55-W high fidelity audio amplifier’s output stage  
Absolute Maximum Ratings (Tc = 25°C)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
CBO  
V
CEO  
V
EBO  
120  
120  
5
V
V
V
A
A
Collector-emitter voltage  
Emitter-base voltage  
Collector current  
I
8
C
Base current  
I
0.8  
B
Collector power dissipation  
(Tc = 25°C)  
P
80  
W
C
Junction temperature  
Storage temperature range  
T
150  
°C  
°C  
j
JEDEC  
JEITA  
T
stg  
55 to 150  
Note: Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the  
reliability significantly even if the operating conditions (i.e.  
operating temperature/current/voltage, etc.) are within the  
absolute maximum ratings.  
TOSHIBA  
2-16C1A  
Weight: 4.7 g (typ.)  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report  
and estimated failure rate, etc).  
1
2006-11-10  

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