2N5564/5565/5566
Vishay Siliconix
SPECIFICATIONS (T = 25_C UNLESS OTHERWISE NOTED)
A
Limits
2N5564
2N5565
2N5566
Parameter
Static
Symbol
Test Conditions
Typa Min Max Min Max Min Max Unit
Gate-Source
V
I
= −1 mA, V = 0 V
−55
−2
−40
−0.5
5
−40
−0.5
5
−40
−0.5
5
(BR)GSS
G
DS
Breakdown Voltage
V
Gate-Source
Cutoff Voltage
V
V
= 15 V, I = 1 nA
DS D
−3
−3
−3
GS(off)
Saturation Drain
I
V
= 15 V, V = 0 V
DS GS
20
mA
30
30
30
DSS
b
Current
V
= −20 V, V = 0 V
−5
−10
−3
−100
−200
−100
−200
−100
−200
pA
nA
pA
nA
GS
DS
Gate Reverse Current
Gate Operating Current
I
GSS
T
= 150_C
A
V
= 15 V, I = 2 mA
D
DG
c
I
G
T
A
= 125_C
−1
Drain-Source
On-Resistance
r
V
= 0 V, I = 1 mA
50
−1.2
0.7
100
1
100
1
100
1
W
DS(on)
GS
D
c
Gate-Source Voltage
V
V
= 15 V, I = 2 mA
DG D
GS
V
Gate-Source
Forward Voltage
V
I = 2 mA , V = 0 V
G DS
GS(F)
Dynamic
Common-Source
g
9
7.5
12.5
45
7.5
12.5
45
7.5
12.5
45
mS
fs
Forward Transconductance
V
V
= 15 V, I = 2 mA
D
DS
DS
f = 1 kHz
Common-Source
Output Conductance
g
os
35
mS
Common-Source
Forward Transconductance
= 15 V, I = 2 mA
D
f = 100 MHz
g
fs
8.5
10
mS
7
7
7
d
Common-Source
Input Capacitance
C
iss
12
3
12
3
12
3
V
V
= 15 V, I = 2 mA
D
f = 1 MHz
DS
DS
pF
Common-Source
Reverse Transfer
Capacitance
C
rss
2.5
12
Equivalent Input
Noise Voltage
= 15 V, I = 2 mA
D
f = 10 Hz
nV⁄
√Hz
e
50
1
50
1
50
1
n
Noise Figure
NF
R
G
= 10 MW
dB
Matching
Differential
|
|
V
–V
V
V
= 15 V, I = 2 mA
5
10
25
20
50
mV
DG
DG
D
GS1 GS2
Gate-Source Voltage
Gate-Source Voltage
Differential Change
with Temperature
|
|
D V
–V
mV/
_C
= 15 V, I = 2 mA
D
= −55 to 125_C
GS1 GS2
10
T
A
DT
I
Saturation Drain
DSS1
V
= 15 V, V = 0 V
GS
0.98
0.95
0.95
1
1
0.95
0.90
1
1
0.95
0.90
1
1
DS
c
Current Ratio
I
DSS2
g
g
V
= 15 V, I = 2 mA
D
f = 1 kHz
fs1
DS
V
Transconductance Ratio
Common Mode
0.98
76
fs2
= 10 to 20 V
D
DG
I
CMRR
dB
c
Rejection Ratio
= 2 mA
Notes
a. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.
b. Pulse test: PW v300 ms duty cycle v3%.
NCBD
c. This parameter not registered with JEDEC.
d. Not a production test.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
Document Number: 70254
S-50150—Rev. E, 24-Jan-05
www.vishay.com
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