Datasheet > 28-3551-10TL

28-3551-10TL

更新时间： 2024-11-11 06:24:15

品牌	Logo	应用领域
ARIES		测试
页数	文件大小	规格书
1页	489K
描述
Universal Zero-Insertion-Force DIP Test Socket

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中文翻译

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技术参数
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28-3551-10TL 技术参数

生命周期：	Active	包装说明：	ROHS COMPLIANT
Reach Compliance Code：	compliant	ECCN代码：	EAR99
风险等级：	5.69	Is Samacsys：	N
其他特性：	STANDARD: UL 94V-0	联系完成配合：	TIN LEAD (200) OVER NICKEL
联系完成终止：	TIN LEAD (200) OVER NICKEL	设备插槽类型：	IC SOCKET
使用的设备类型：	DIP28	外壳材料：	POLYPHENYLENE SULFIDE
JESD-609代码：	e0	触点数：	28
Base Number Matches：	1

28-3551-10TL 数据手册

Series X55X Universal Zero-Insertion-Force

DIP Test Socket

FEATURES

• Aries Universal Test Socket accepts devices on 0.300 to 0.600 [7.62 to 15.24] cen-

ters.

• All pin count sockets go into PCB with either 0.300 or 0.600 [7.62 to 15.24] centers.

• Contacts are normally closed to eliminate dependence on plastic to sustain contact.

• Socket handle can be configured with closed contacts (on) when in the UP or DOWN

position, and can be mounted on either the right or left side.

• Sockets can be soldered into PCBs or plugged into any socket. Socket fits into Aries’

or any competitive test socket receptacle.

GENERAL SPECIFICATIONS

• SOCKET BODY: black UL 94V-0 glass-filled Polyphenylene Sulfide (PPS)

• HANDLE: Stainless Steel

CUSTOMIZATION: In addition to the standard products shown

on this page, Aries specializes in custom design and production.

Special materials, platings, sizes, and configurations can be

furnished, depending on the quantity. NOTE: Aries reserves the

right to change product general specifications without notice.

• HANDLE KNOB: Brass 360, 1/2-hard

• CONTACTS: BeCu 172 per QQ-C-533 or NiB (Spinodal)

• CONTACT PLATING: 50μ [1.27μ] min. Ni under-plate per QQ-N-290, over-plated

with either 200μ [5.08μ] min. matte Sn per ASTM

ORDERING INFORMATION

B545-97 or 200μ [5.08μ] 90/10 Sn/Pb per MIL-

T-10727 or 10μ [0.254μ] min. Au per MIL-G-45204

• SPINODAL CONTACT PLATING: 50μ [1.27μ] min.

NiB

• CONTACT CURRENT RATING: 1 amp

• INSULATION RESISTANCE: 1000 mΩ min.

• DIELECTRIC WITHSTANDING VOLTAGE: 1000 VAC

• LIFE CYCLE: 25,000 to 50,000 cycles

• OPERATING TEMPERATURE: -67°F [-55°C] min.;

221°F [105°C] max. for Sn plating; 302°F [150°C]

for Au plating; 392°F [200°C] for NiB plating

• RETENTION FORCE (closed): 55g/pin based on a

0.020 [0.51] dia. test lead

XX-X55X-1 X

Pins

24, 28, 32, 36,

40, 42, 44, 48

Plating

0 = Sn over Ni

0TL = Sn/Pb over Ni

Row-to-Row Spacing (btm)

3 = 0.300 [7.62]

6 = 0.600 [15.24]

1 = Au over Ni

6 = NiB (Spinodal)

Solder Pin Tail

Handle Options

1 = Left, up is on

2 = Right, up is on

3 = Left, down is on

4 = Right, down is on (std)

NOTE: “on” = closed contacts

• ACCEPTS LEADS: 0.015-0.045 [0.38-1.14] wide,

0.110-0.280 [2.79-7.11] long

MOUNTING CONSIDERATIONS

• See Socket Footprint below

ALL DIMENSIONS: INCHES [MILLIMETERS]

ALL TOLERANCES: 0.005 [0.13] UNLESS OTHERWISE SPECIFIED

“A” = (NO. OF PINS PER ROW x 0.100 [2.54]) + 0.590 [14.99]

“B” = (NO. OF PINS PER ROW -1) x 0.100 [2.54]

“C” = (NO. OF PINS PER ROW x 0.100 [2.54] + 0.415 [10.54]

CONSULT FACTORY FOR OTHER SIZES AND CONFIGURATIONS

Bristol, PA 19007-6810 USA

TEL (215) 781-9956 • FAX (215) 781-9845

WWW.ARIESELEC.COM• INFO@ARIESELEC.COM

10001

PRINTOUTS OF THIS DOCUMENT MAY BE OUT OF DATE AND SHOULD BE CONSIDERED UNCONTROLLED

Rev. AA

中文翻译

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与28-3551-10TL相关器件

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28355111	ARIES	获取价格	Series 55 Universal Zero-Insertion-Force DIP Test Socket
28-3551-11	ARIES	获取价格	Universal Zero-Insertion-Force DIP Test Socket
28355116	ARIES	获取价格	Series 55 Universal Zero-Insertion-Force DIP Test Socket
28-3551-16	ARIES	获取价格	Universal Zero-Insertion-Force DIP Test Socket
28-3551-18	ARIES	获取价格	High-Temperature Universal Zero-Insertion-Force DIP Test Socket
2835516	ARIES	获取价格	Series 55 Universal Zero-Insertion-Force DIP Test Socket
28355210	ARIES	获取价格	Series 55 Universal Zero-Insertion-Force DIP Test Socket
28-3552-10	ARIES	获取价格	Universal Zero-Insertion-Force DIP Test Socket
28355210TL	ARIES	获取价格	Series 55 Universal Zero-Insertion-Force DIP Test Socket
28-3552-10TL	ARIES	获取价格	Universal Zero-Insertion-Force DIP Test Socket

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