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1SS417CT PDF预览

1SS417CT

更新时间: 2024-11-18 12:23:03
品牌 Logo 应用领域
东芝 - TOSHIBA 整流二极管开关测试
页数 文件大小 规格书
3页 179K
描述
High Speed Switching Application

1SS417CT 技术参数

是否Rohs认证: 符合生命周期:Active
包装说明:R-XBCC-N2针数:2
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8541.10.00.70风险等级:5.63
Is Samacsys:N应用:GENERAL PURPOSE
配置:SINGLE二极管元件材料:SILICON
二极管类型:RECTIFIER DIODE最大正向电压 (VF):0.62 V
JESD-30 代码:R-XBCC-N2最大非重复峰值正向电流:1 A
元件数量:1相数:1
端子数量:2最高工作温度:100 °C
最低工作温度:-40 °C最大输出电流:0.1 A
封装主体材料:UNSPECIFIED封装形状:RECTANGULAR
封装形式:CHIP CARRIER峰值回流温度(摄氏度):NOT SPECIFIED
最大功率耗散:0.1 W认证状态:Not Qualified
最大重复峰值反向电压:45 V最大反向电流:5 µA
反向测试电压:40 V表面贴装:YES
技术:SCHOTTKY端子形式:NO LEAD
端子位置:BOTTOM处于峰值回流温度下的最长时间:NOT SPECIFIED
Base Number Matches:1

1SS417CT 数据手册

 浏览型号1SS417CT的Datasheet PDF文件第2页浏览型号1SS417CT的Datasheet PDF文件第3页 
1SS417CT  
TOSHIBA Diode Silicon Epitaxial Schottky Barrier Type  
1SS417CT  
High Speed Switching Application  
Unit: mm  
0.6±0.05  
Small package  
Low forward voltage: V  
= 0.56 V (typ.)  
F (3)  
Low reverse current: I = 5 μA (max)  
R
Absolute Maximum Ratings (Ta = 25°C)  
0.5±0.03  
Characteristic  
Symbol  
Rating  
Unit  
+0.02  
-0.03  
0.05±0.03  
0.38  
Maximum (peak) reverse Voltage  
Reverse voltage  
V
45  
40  
V
V
RM  
V
R
Maximum (peak) forward current  
Average forward current  
Surge current (10ms)  
I
200  
mA  
mA  
A
FM  
I
100  
O
I
1
FSM  
P *  
Power dissipation  
100  
mW  
°C  
°C  
°C  
CST2  
Junction temperature  
T
125  
j
Storage temperature range  
Operating temperature range  
T
55 to 125  
40 to 100  
stg  
opr  
JEDEC  
JEITA  
T
TOSHIBA  
1-1P1A  
*
Mounted on a glass epoxy circuit board of 20 mm× 20 mm,  
pad dimension of 4 mm× 4 mm.  
Weight: 0.7 mg (typ.)  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Electrical Characteristics (Ta = 25°C)  
Test  
Circuit  
Characteristic  
Symbol  
Test Condition  
= 1 mA  
Min  
Typ.  
Max  
Unit  
V
V
V
V
I
I
I
0.28  
0.36  
0.56  
F (1)  
F (2)  
F (3)  
F
F
F
Forward voltage  
= 10 mA  
= 100 mA  
0.62  
5
Reverse current  
I
V
V
= 40 V  
R
R
R
μA  
Total capacitance  
C
T
= 0 V, f = 1 MHz  
15  
pF  
Marking  
Equivalent Circuit (Top View)  
X
1
2009-01-08  

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