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WW12WR160FTLJ PDF预览

WW12WR160FTLJ

更新时间: 2024-10-29 16:58:23
品牌 Logo 应用领域
华新科技 - WALSIN /
页数 文件大小 规格书
9页 836K
描述
1206(3216), 0.160Ω, ±1%, 1/3W

WW12WR160FTLJ 数据手册

 浏览型号WW12WR160FTLJ的Datasheet PDF文件第3页浏览型号WW12WR160FTLJ的Datasheet PDF文件第4页浏览型号WW12WR160FTLJ的Datasheet PDF文件第5页浏览型号WW12WR160FTLJ的Datasheet PDF文件第6页浏览型号WW12WR160FTLJ的Datasheet PDF文件第8页浏览型号WW12WR160FTLJ的Datasheet PDF文件第9页 
Approval sheet  
TEST AND REQUIREMENTS(AEC Q200)  
TEST PROCEDURE  
REQUIREMENT  
Temperature Coefficient Natural resistance change per change in degree centigrade. Refer to  
of Resistance(T.C.R)  
“QUICK REFERENCE  
DATA”  
R2 R  
R
1t2 t1   
106 (ppm/C) t1 : 25°C  
1
Clause 4.8  
R1 : Resistance at reference temperature 25°C  
R2 : Resistance at test temperature 155°C  
High temperature  
exposure  
Test 1000 hrs./ @T=155/ Un-powered.  
J: R/R max. ±(3%+0.5m)  
F: R/R max. ±(1%+0.5m)  
no visible damage  
Measurement at 24±2 hours after test conclusion.  
MIL-STD-202-Method  
108  
Temperature cycling  
JESD22 Method  
JA-104  
30 minutes at -55C3C, 2~3 minutes at 20°C+5°C-1°C, 30 J: R/R max. ±(1%+0.5m)  
minutes at +125C3C, 2~3 minutes at 20°C+5°C-1°C, 1000  
cycles  
F: R/R max.  
±(0.5%+0.5m) no visible  
damage  
Moisture resistance  
Test 65/ 80~100%RH/ 10Cycles(t=24hrs/cycle).  
J: R/R max. ±(1%+0.5m)  
F: R/R max.  
±(0.5%+0.5m) no visible  
MIL-STD-202-Method  
106  
Measurement at 24±2 hours after test conclusion.  
damage  
Bias Humidity  
Test 1000 hours/ @85/85% RH./ 10% of operation power.  
J: R/R max. ±(3%+0.5m)  
F: R/R max. ±(1%+0.5m)  
no visible damage  
MIL-STD-202-Method  
103  
Measurement at 24±2 hours after test conclusion.  
Operation life  
Test 1000 hrs./ TA=125/ 35% of operating power.  
J: R/R max. ±(3%+0.5m)  
F: R/R max. ±(1%+0.5m)  
no visible damage  
MIL-STD-202-Method  
108  
Measurement at 24±2 hours after test conclusion.  
External visual  
Electrical test not required. Inspect device construction,  
marking and workmanship  
no visible damage and  
marking follow spec  
MIL-STD-883-Method  
2009  
Physical dimensions  
JESD22 Method  
JB-100  
The chip dimension (L, W, C, D, T) prescribed in the detail  
specification shall be checked by Protech 2.5D.  
Within spec defined  
Mechanic shock  
Test Peak value:100g's / Wave: Hail-sine / Duration:6ms /  
Velocity:12.3ft/sec.  
no visible damage and  
within specified tolerance  
MIL-STD-202-Method  
213  
Vibration  
Test 5g’s for 20min., 12 cycles each of 3 orientations  
J: R/R max. ±(1%+0.5m)  
F: R/R max.  
±(0.5%+0.5m) no visible  
MIL-STD-202-Method  
204  
damage  
Resistance to soldering  
heat(R.S.H)  
Un-mounted chips completely immersed for 10±1 second in a  
SAC solder bath at 270±5ºC  
J: R/R max. ±(1%+0.5m)  
F: R/R max.  
MIL-STD-202-Method  
210  
±(0.5%+0.5m) no visible  
damage  
Thermal shock  
Test -55 to 155/ dwell time 15min/ Max transfer time 20sec/  
300cycles  
J: R/R max. ±(1%+0.5m)  
F: R/R max.  
±(0.5%+0.5m) no visible  
MIL-STD-202-Method  
107  
damage  
Page 7 of 9  
ASC_WWxxW_J_AUTO_V04  
Dec – 2023  

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