Datasheet > WQCW2520Z0GR62PB

WQCW2520Z0GR62PB

更新时间： 2024-10-29 16:59:23

品牌	Logo	应用领域
华新科技 - WALSIN		/
页数	文件大小	规格书
7页	269K
描述
SMD Wire Wound Ceramic Chip RF Inductor(AEC-Q200) / WQCW Series 620, 45, 300mA

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中文翻译

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数据手册

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WQCW2520Z0GR62PB 数据手册

RELIABILITY PERFORMANCE

Test Item

Test Condition

Standard Source

1000 hrs. at rated operating temperature (e.g. 125°C part

can be stored for 1000 hrs. @ 125°C. Same applies f or

105°C and 85°C. Unpowered.

High Temperature

Exposure (Storage)

MIL-STD-202

Method 108

Measurement at 24±4 hours after test conclusion.

1000 cycles (-40°C to +125°C). Note: If 85°C part o r 105°C

part the 1000 cycles will be at that temperature.

Measurement at 24±4 hours after test conclusion. 30min

maximum dwell time at each temperature extreme. 1 min.

maximum transition time.

JESD22

Method JA-104

Temperature Cycling

1000 hours 85°C/85%RH. Unpowered.

Measurement at 24±4 hours after test conclusion.

MIL-STD-202

Method 103

Biased Humidity

Operational Life

1000 hrs. @ 105°C. If 85°C or 125°C part will be te sted at

that temperature.

MIL-PRF-27

Measurement at 24±4 hours after test conclusion.

Method 213. Condition C,

Peak Value: 100g’s, Duration: 6ms, Waveform: Half-sine

Velocity Change: 12.3ft/sec

MIL-STD-202

Method 213

Mechanical Shock

Vibration

5g's for 20 minutes, 12 cycles each of 3 orientations.

Note: Use 8"X5" PCB, .031" thick, 7 secure points on one

long side and 2 secure points at corners of opposite sides.

Parts mounted within 2" from any secure point. Test from

10-2000 Hz.

MIL-STD-202

Method 204

Condition B No pre-heat of samples. Note: Single Wave

Solder - Procedure 2 for SMD and Procedure 1 for Leaded

with solder within 1.5mm of device body.

Resistance to Soldering

Heat

MIL-STD-202

Method 210

Passive Component Human Body Model (HBM)

Electrostatic Discharge (ESD) Test.

Only direct contact discharge, record the voltage value

what the sample can pass.

AEC-Q200-002

ISO/DIS10605

ESD

For both Leaded & SMD. Electrical Test not required.

Magnification 50X. Conditions:

Leaded: Method A @ 235°C, category 3. SMD:

a) Method B, 4 hrs @ 155°C dry heat @ 235°C

b) Method B @ 215°C category 3.

Solderability

J-STD-002

c) Method D category 3 @ 260°C.

Flammability

Board Flex

V-0 or V-1 Acceptable

UL-94

60 sec minimum holding time.

Force of 1.8kg for 60 seconds.

AEC-Q200-005

AEC-Q200-006

Terminal Strength

(SMD)

Page 5 of 7

ASC_WQCW2520 Series_Auto

Nov. 2018

1 2 3 456 7

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与WQCW2520Z0GR62PB相关器件

型号	品牌	获取价格	描述	数据表
WQCW2520Z0GR68PB	WALSIN	获取价格	SMD Wire Wound Ceramic Chip RF Inductor(AEC-Q200) / WQCW Series 680, 45, 400mA
WQCW2520Z0GR75PB	WALSIN	获取价格	SMD Wire Wound Ceramic Chip RF Inductor(AEC-Q200) / WQCW Series 750, 45, 360mA
WQCW2520Z0GR82PB	WALSIN	获取价格	SMD Wire Wound Ceramic Chip RF Inductor(AEC-Q200) / WQCW Series 820, 45, 400mA
WQCW2520Z0GR91PB	WALSIN	获取价格	SMD Wire Wound Ceramic Chip RF Inductor(AEC-Q200) / WQCW Series 910, 35, 380mA
WQCW2520Z0J10NPB	WALSIN	获取价格	SMD Wire Wound Ceramic Chip RF Inductor(AEC-Q200) / WQCW Series 10, 50, 1A
WQCW2520Z0J12NPB	WALSIN	获取价格	SMD Wire Wound Ceramic Chip RF Inductor(AEC-Q200) / WQCW Series 12, 50, 1A
WQCW2520Z0J15NPB	WALSIN	获取价格	SMD Wire Wound Ceramic Chip RF Inductor(AEC-Q200) / WQCW Series 15, 50, 1A
WQCW2520Z0J18NPB	WALSIN	获取价格	SMD Wire Wound Ceramic Chip RF Inductor(AEC-Q200) / WQCW Series 18, 50, 1A
WQCW2520Z0J1R0PB	WALSIN	获取价格	SMD Wire Wound Ceramic Chip RF Inductor(AEC-Q200) / WQCW Series 1000, 35, 370mA
WQCW2520Z0J1R2PB	WALSIN	获取价格	SMD Wire Wound Ceramic Chip RF Inductor(AEC-Q200) / WQCW Series 1200, 35, 310mA

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