5秒后页面跳转
WQCF2012Z0M371PB PDF预览

WQCF2012Z0M371PB

更新时间: 2024-10-29 17:00:19
品牌 Logo 应用领域
华新科技 - WALSIN /
页数 文件大小 规格书
6页 275K
描述
Common Mode Choke (AEC-Q200) / WQCF Series 370, 280mA

WQCF2012Z0M371PB 数据手册

 浏览型号WQCF2012Z0M371PB的Datasheet PDF文件第1页浏览型号WQCF2012Z0M371PB的Datasheet PDF文件第2页浏览型号WQCF2012Z0M371PB的Datasheet PDF文件第3页浏览型号WQCF2012Z0M371PB的Datasheet PDF文件第4页浏览型号WQCF2012Z0M371PB的Datasheet PDF文件第6页 
RELIABILITY PERFORMANCE  
Test Item  
Standard  
Source  
Test Condition  
1000 hrs. at rated operating temperature (e.g. 125°C part  
can be stored for 1000 hrs. @ 125°C. Same applies f or  
105°C and 85°C. Unpowered.  
High Temperature  
Exposure (Storage)  
MIL-STD-202  
Method 108  
Measurement at 24±4 hours after test conclusion.  
1000 cycles (-40°C to +125°C). Note: If 85°C part o r 105°C  
part the 1000 cycles will be at that temperature.  
Measurement at 24±4 hours after test conclusion. 30min  
maximum dwell time at each temperature extreme. 1 min.  
maximum transition time.  
JESD22  
Method JA-104  
Temperature Cycling  
1000 hours 85°C/85%RH. Unpowered.  
Measurement at 24±4 hours after test conclusion.  
MIL-STD-202  
Method 103  
Biased Humidity  
Operational Life  
Mechanical Shock  
1000 hrs. @ 105°C. If 85°C or 125°C part will be te sted at  
that temperature.  
Measurement at 24±4 hours after test conclusion.  
MIL-PRF-27  
Method  
213.  
Condition  
C,  
MIL-STD-202  
Method 213  
Peak Value: 100g’s, Duration: 6ms, Waveform: Half-sine  
Velocity Change: 12.3ft/sec  
5g's for 20 minutes, 12 cycles each of 3 orientations.  
Note: Use 8"X5" PCB, .031" thick, 7 secure points on one  
long side and 2 secure points at corners of opposite  
sides. Parts mounted within 2" from any secure point.  
Test from 10-2000 Hz.  
MIL-STD-202  
Method 204  
Vibration  
Condition B No pre-heat of samples. Note: Single Wave  
Resistance to Soldering Heat Solder - Procedure 2 for SMD and Procedure 1 for Leaded  
with solder within 1.5mm of device body.  
MIL-STD-202  
Method 210  
Passive Component Human Body Model (HBM)  
Electrostatic Discharge (ESD) Test.  
Only direct contact discharge, record the voltage value  
what the sample can pass.  
AEC-Q200-002  
Or  
ISO/DIS10605  
ESD  
For both Leaded & SMD. Electrical Test not required.  
Magnification 50X. Conditions:  
Leaded: Method A @ 235°C, category 3. SMD:  
a) Method B, 4 hrs @ 155°C dry heat @ 235°C  
Solderability  
J-STD-002  
b) Method B @ 215°C category 3.  
c) Method D category 3 @ 260°C.  
Flammability  
V-0 or V-1 Acceptable  
UL-94  
Board Flex  
60 sec minimum holding time.  
Force of 900g for 60 seconds.  
AEC-Q200-005  
AEC-Q200-006  
Terminal Strength (SMD)  
Page 5 of 6  
WQCF2012 Series_V1.0_Auto  
Oct. Y2017  

与WQCF2012Z0M371PB相关器件

型号 品牌 获取价格 描述 数据表
WQCF2012Z0M431PB WALSIN

获取价格

Common Mode Choke (AEC-Q200) / WQCF Series 430, 280mA
WQCF2012Z0M601PB WALSIN

获取价格

Common Mode Choke (AEC-Q200) / WQCF Series 600, 240mA
WQCF2012Z0M670PB WALSIN

获取价格

Common Mode Choke (AEC-Q200) / WQCF Series 67, 400mA
WQCF2012Z0M750PB WALSIN

获取价格

Common Mode Choke (AEC-Q200) / WQCF Series 75, 400mA
WQCF2012Z0M751PB WALSIN

获取价格

Common Mode Choke (AEC-Q200) / WQCF Series 750, 220mA
WQCF2012Z0M900PB WALSIN

获取价格

Common Mode Choke (AEC-Q200) / WQCF Series 90, 330mA
WQCM0201A0B12NTB WALSIN

获取价格

Multi-Layer Ceramic High Frequency Inductors
WQCM0201A0B1N2TB WALSIN

获取价格

Multi-Layer Ceramic High Frequency Inductors
WQCM0201A0BR10TB WALSIN

获取价格

Multi-Layer Ceramic High Frequency Inductors
WQCM0201A0C12NTB WALSIN

获取价格

Multi-Layer Ceramic High Frequency Inductors