5秒后页面跳转
WCI1608CP82NJ PDF预览

WCI1608CP82NJ

更新时间: 2024-10-29 16:59:19
品牌 Logo 应用领域
华新科技 - WALSIN /
页数 文件大小 规格书
9页 1011K
描述
SMD Wire Wound Ceramic Chip RF Inductor / WCI Series 82, 34, 400mA

WCI1608CP82NJ 数据手册

 浏览型号WCI1608CP82NJ的Datasheet PDF文件第3页浏览型号WCI1608CP82NJ的Datasheet PDF文件第4页浏览型号WCI1608CP82NJ的Datasheet PDF文件第5页浏览型号WCI1608CP82NJ的Datasheet PDF文件第6页浏览型号WCI1608CP82NJ的Datasheet PDF文件第7页浏览型号WCI1608CP82NJ的Datasheet PDF文件第8页 
13. Reliability Performance  
Reliability Experiment For Electrical  
Test Item  
Accept criteria  
Test Condition  
Standard Source  
1.Change from an initial  
value L:within±5%  
2.no visible damage.  
1.Change from an initial  
value L:within±5%  
2.no visible damage.  
1.Change from an initial  
value L:within±5%  
MIL-STD-202H  
Method 103  
Test Condition B  
+40± 2, humidity of 90% ±5% (total 96 hours).  
Humidity Test  
1.Temperature: +125±2.  
2.Test time: 72±2hrs.  
High Temperature  
Test  
IEC 68-2  
Test Condition B  
1.Temperature: -25±2.  
2.Test time: 72±2hrs.  
Low Temperature  
Test  
IEC 68-2  
Test Condition A  
2.no visible damage.  
Reference  
MIL-STD-202H  
Method 107  
+125±5(30 minutes) ~ -65±5(30  
minutes), temperature switch time: 5 minutes  
(total 50 cycles).  
1.Change from an initial  
value L:within±5%  
2.no visible damage.  
Thermal Shock  
Life Test  
Test Condition B-2  
Reference  
MIL-STD-202H  
Method 108  
1.Change from an initial  
value L:within±5%  
2.no visible damage.  
+70±5(250Hours).  
Test Condition B  
Reliability Experiment For Physical  
Test Item  
Accept criteria  
Test Condition  
Standard Source  
1.Change from an initial  
value L:within±5%  
2.no visible damage.  
10-55-10HZ, amplitude: 1.5mm, direction: X, Y, Z MIL-STD-202H  
Vibration Test  
axes, each axis 2 hours (total 6 hours).  
Method 201  
Reference  
IR/convection reflow: Peak Temp 250±5for  
30±5Sec. in air, Through 3 Cycle. Temperature  
Ramp:+1~4°C/sec.; Above 183°C, must keep 90 s -  
120 s.  
MIL-STD-202H  
Method 210  
Test Condition K  
(Reflow)  
Solder Heat  
Resistance Test  
1.no visible damage.  
Solder temp: 245±5,  
Immersion time: 5 second.  
Immersion rate: 25±6mm/sec.  
1. Lead must have 95%  
above coverage.  
J-STD-002D  
Test condition B1  
Solder Ability Test  
Page 9 of 9  

与WCI1608CP82NJ相关器件

型号 品牌 获取价格 描述 数据表
WCI1608CP8N2G WALSIN

获取价格

SMD Wire Wound Ceramic Chip RF Inductor / WCI Series 8.2, 25, 700mA
WCI1608CP8N2J WALSIN

获取价格

SMD Wire Wound Ceramic Chip RF Inductor / WCI Series 8.2, 25, 700mA
WCI1608CP8N2K WALSIN

获取价格

SMD Wire Wound Ceramic Chip RF Inductor / WCI Series 8.2, 25, 700mA
WCI1608CP8N4G WALSIN

获取价格

SMD Wire Wound Ceramic Chip RF Inductor / WCI Series 8.4, 28, 700mA
WCI1608CP8N4J WALSIN

获取价格

SMD Wire Wound Ceramic Chip RF Inductor / WCI Series 8.4, 28, 700mA
WCI1608CP8N4K WALSIN

获取价格

SMD Wire Wound Ceramic Chip RF Inductor / WCI Series 8.4, 28, 700mA
WCI1608CP8N5G WALSIN

获取价格

SMD Wire Wound Ceramic Chip RF Inductor / WCI Series 8.5, 28, 700mA
WCI1608CP8N5J WALSIN

获取价格

SMD Wire Wound Ceramic Chip RF Inductor / WCI Series 8.5, 28, 700mA
WCI1608CP8N5K WALSIN

获取价格

SMD Wire Wound Ceramic Chip RF Inductor / WCI Series 8.5, 28, 700mA
WCI1608CP8N7G WALSIN

获取价格

SMD Wire Wound Ceramic Chip RF Inductor / WCI Series 8.7, 28, 700mA