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UPD75P3036 PDF预览

UPD75P3036

更新时间: 2024-11-05 22:59:35
品牌 Logo 应用领域
日电电子 - NEC 微控制器
页数 文件大小 规格书
64页 449K
描述
4-BIT SINGLE-CHIP MICROCONTROLLER

UPD75P3036 数据手册

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DATA SHEET  
MOS INTEGRATED CIRCUIT  
µPD75P3036  
4-BIT SINGLE-CHIP MICROCONTROLLER  
The µPD75P3036 replaces the µPD753036’s internal mask ROM with a one-time PROM or EPROM.  
Because the µPD75P3036 supports programming by users, it is suitable for use in prototype testing for system  
development using the µPD753036 and for use in small-scale production.  
Caution The µPD75P3036KK-T is not designed to guarantee the reliability required for use in mass-  
*
production. Please use it only for performance evaluation during testing and test production runs.  
Detailed descriptions of functions are provided in the following document. Be sure to read the document  
before designing.  
µPD753036 User’s Manual : U10201E  
FEATURES  
Compatible with µPD753036  
Internal PROM: 16384 × 8 bits  
µPD75P3036KK-T  
: Reprogrammable (ideally suited for system evaluation)  
µPD75P3036GC, 75P3036GK : One-time programmable (ideally suited for small-scale production)  
Internal RAM: 768 × 4 bits  
Can operate in the same power supply voltage as the mask version µPD753036  
VDD = 1.8 to 5.5 V  
LCD controller/driver  
A/D converter  
Caution  
Mask-option pull-up resistors are not provided in this device.  
ORDERING INFORMATION  
Part Number  
Package  
Internal PROM  
Quality Grade  
Standard  
µPD75P3036GC-3B9  
µPD75P3036GK-BE9  
µPD75P3036KK-T  
80-pin plastic QFP  
One-time PROM  
(14 × 14 mm, 0.65-mm pitch)  
80-pin plastic TQFP  
One-time PROM  
EPROM  
Standard  
(fine pitch) (12 × 12 mm, 0.5-mm pitch)  
80-pin ceramic WQFN  
Not applicable  
*
Please refer to "Quality Grades on NEC Semiconductor Devices" (Document No. C11531E) published by  
NEC Corporation to know the specification of quality grade on the devices and its recommended applications.  
In this document, the term PROM is used in parts common to one-time PROM versions and EPROM versions.  
The information in this document is subject to change without notice.  
Document No. U11575EJ1V0DS00 (1st edition)  
(Previous No. IP-3657)  
Date Published November 1996 P  
Printed in Japan  
The mark  
shows major revised points.  
*
1996  
©

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