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UCJ1H221MCL

更新时间： 2024-11-04 03:24:31
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尼吉康 - NICHICON 电容器铝电解电容器
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ALUMINUM ELECTROLYTIC CAPACITORS

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UCJ1H221MCL 数据手册

  
ALUMINUM ELECTROLYTIC CAPACITORS  
Chip Type, High Reliability.  
Low temperature ESR specification.  
CJ series  
Chip type, high temperature range, for +125°C use.  
Added ESR specification after the test at 40°C  
–
(φ6.3 sizes provide only for the first stage. )  
Applicable to automatic mounting machine using carrier tape.  
Adapted to the RoHS directive (2002/95/EC).  
aAtdded40E°SCR specification  
–
UB  
C J  
Specifications  
Item  
Performance Characteristics  
Category Temperature Range  
Rated Voltage Range  
–40 ~ +125°C  
10 ~ 50V  
10 ~ 470µF  
Capacitance Range  
Rated  
Capacitance Tolerance  
Leakage Current  
±20% at 120Hz, 20°C  
After 1 minute's application of rated voltage, leakage current is not more than 0.03CVor 4(µA) , whichever is greater.  
Measurement frequency : 120Hz, Temperature : 20°C  
Rated voltage (V)  
10  
16  
25  
35  
50  
tan  
δ
tan δ (MAX.)  
0.32  
0.24  
0.21  
0.18  
0.18  
Measurement frequency : 120Hz  
Rated voltage (V)  
10  
12  
16  
8
25  
6
35  
4
50  
4
Stability at Low Temperature  
Impedance ratio  
ZT / Z20 (MAX.)  
Z–40°C / Z+20°C  
Capacitance change  
tan δ  
Within ±30% of initial value  
300% or less of intial specified value  
Initial specified value or less  
After 2000 hours' application of rated voltage at  
125°C, capacitors meet the characteristic  
requirements listed at right.  
Endurance  
Shelf Life  
Leakage current  
After storing the capacitors under no load at 125°C for 1000 hours, and after performing voltage treatment based on JIS C 5101-4  
clause 4.1 at 20°C, they will meet the specified value for endurance characteristics listed above.  
The capacitors shall be kept on the hot plate maintained at 250°C  
Capacitance change  
tan δ  
Within ±10% of initial value  
Initial specified value or less  
Initial specified value or less  
Resistance to soldering  
heat  
for 30 seconds. After removing from the hot plate and restored  
at room temperature, they meet the characteristic requirements  
listed at right.  
Leakage current  
Marking  
Black print on the case top.  
Type numbering system (Example : 10V 100 F)  
µ
Chip Type  
(φ6.3 × 8.7)  
(φ8 × 10, φ10 × 10)  
Dimensions  
V
Code  
10  
16  
25  
35  
1V  
50  
1H  
Cap.(µF)  
10  
1A  
1C  
1E  
100  
220  
330  
470  
101  
221  
331  
471  
6.3 × 8.7 14  
-
-
-
-
95  
6.3 × 8.7 14  
-
-
95  
95  
6.3 × 8.7 14  
6.3 × 8.7 14  
-
-
-
6.0  
4.5  
4.5  
95 6.3 × 8.7  
22  
33  
14  
14  
14  
95 6.3 × 8.7 14  
95  
95 10 × 10 1.5 4.5 330  
95 6.3 × 8.7  
95 6.3 × 8.7  
8 × 10 2.0 6.0 200  
6.3 × 8.7 14  
-
95 6.3 × 8.7 14  
47  
6.3 × 8.7 14  
-
95  
8 × 10 2.0 6.0 250  
8 × 10  
2.0  
1.5  
1.5  
250 10 × 10 1.5 4.5  
10 × 10 1.5 4.5 330  
100  
220  
330  
470  
400  
after  
8 × 10 2.0 6.0 250 10 × 10 1.5 4.5 400 10 × 10  
10 × 10 1.5 4.5 400 10 × 10 1.5 4.5 400 10 × 10  
10 × 10 1.5 4.5 400  
400 10 × 10  
1.5 4.5 400  
Case size  
Initial torture  
test  
Rated  
ripple  
φ D  
L
×
400  
(mm)  
ESR  
Max. ESR (Ω) at -40°C 100kHz, Rated Ripple (mArms) at 125°C 100kHz  
Frequency coefficient of rated ripple current  
Frequency  
50 Hz  
120 Hz  
300 Hz  
1 kHz  
10 kHz~  
1.00  
Taping specifications are given in page 24.  
Recommended land size, soldering by reflow are given in page 25, 26.  
Please refer to page 3 for the minimum order quantity.  
Coefficient  
0.35  
0.50  
0.64  
0.83  
-
CAT.8100V 2  
1

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