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UCC3810-DIE PDF预览

UCC3810-DIE

更新时间: 2024-11-25 01:06:43
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德州仪器 - TI /
页数 文件大小 规格书
5页 120K
描述
DUAL CHANNEL SYNCHRONIZED CURRENT-MODE PWM

UCC3810-DIE 数据手册

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UCC3810-DIE  
www.ti.com  
SLUSBM2 JUNE 2013  
DUAL CHANNEL SYNCHRONIZED CURRENT-MODE PWM  
Check for Samples: UCC3810-DIE  
1
FEATURES  
DESCRIPTION  
The UCC3810-DIE is  
Single Oscillator Synchronizes Two PWMs  
Startup Supply Current  
a
high-speed BiCMOS  
controller integrating two synchronized pulse width  
modulators for use in off-line and dc-to-dc power  
supplies. The UCC3810-DIE provides perfect  
synchronization between two PWMs by using the  
same oscillator. The oscillator’s sawtooth waveform  
can be used for slope compensation if required.  
Operating Supply Current  
Internal Soft-Start  
Full-Cycle Fault Restart  
Internal Leading-Edge Blanking of the Current  
Sense Signal  
Using  
a
toggle flip-flop to alternate between  
75-ns Typical Response from Current Sense to  
Output  
modulators, the UCC3810-DIE ensures that one  
PWM does not slave, interfere, or otherwise affect the  
other PWM. This toggle flip- flop also ensures that  
each PWM is limited to 50% maximum duty cycle,  
insuring adequate off-time to reset magnetic  
elements.  
1.5% Tolerance Voltage Reference  
ORDERING INFORMATION(1)  
PACKAGE  
DESIGNATOR  
PRODUCT  
PACKAGE  
ORDERABLE PART NUMBER  
PACKAGE QUANTITY  
UCC3810TD1  
UCC3810TD2  
100  
10  
UCC3810  
TD  
Bare die in waffle pack(2)  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
web site at www.ti.com.  
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality  
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room  
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not  
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2013, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  

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