UCC27200, UCC27201
www.ti.com ....................................................................................................................................... SLUS746B–DECEMBER 2006–REVISED NOVEMBER 2008
120-V Boot, 3-A Peak, High Frequency, High-Side/Low-Side Driver
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FEATURES
CONTENTS
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Specified from -40 °C to 140 °C
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Drives Two N-Channel MOSFETs in
High-Side/Low-Side Configuration
Device Ratings
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Electrical Characteristics
Device Information
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Maximum Boot Voltage 120 V
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14
22
Maximum VDD Voltage 20 V
On-Chip 0.65-V VF, 0.6-Ω RD Bootstrap Diode
Greater than 1 MHz of Operation
20-ns Propagation Delay Times
3-A Sink, 3-A Source Output Currents
8-ns Rise/7-ns Fall Time with 1000-pF Load
1-ns Delay Matching
Application Information
Additional References
DESCRIPTION
The UCC27200/1 family of high frequency N-Channel
MOSFET drivers include a 120-V bootstrap diode and
high-side/low-side driver with independent inputs for
maximum control flexibility. This allows for N-Channel
MOSFET control in half-bridge, full-bridge, two-switch
forward and active clamp forward converters. The
low-side and the high-side gate drivers are
independently controlled and matched to 1-ns
between the turn-on and turn-off of each other.
Under Voltage Lockout for High-Side and
Low-Side Driver
APPLICATIONS
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Power Supplies for Telecom, Datacom, and
Merchant Markets
Half-Bridge Applications and Full-Bridge
Converters
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Isolated Bus Architecture
Two-Switch Forward Converters
Active-Clamp Forward Converters
High Voltage Synchronous-Buck Converters
Class-D Audio Amplifiers
Simplified Application Diagram
+12V
+100V
SECONDARY
SIDE
VDD
HB
CIRCUIT
HI
LI
DRIVE
HI
HO
HS
PWM
CONTROLLER
LO
DRIVE
LO
UCC27200/1
VSS
ISOLATION
AND
FEEDBACK
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Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2
PowerPad is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2006–2008, Texas Instruments Incorporated