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UC1834-DIE
SLOS898 –NOVEMBER 2014
UC1834-DIE High Efficiency Linear Regulator
1 Features
3 Description
The UC1834-DIE integrated circuit is optimized for
the design of low input-output differential linear
regulator. A high-gain amplifier and sink or source
drive outputs facilitate high-output current designs,
which use an external pass device. With both positive
and negative precision references, either polarity of
regulator can be implemented. A current sense
amplifier with a low, adjustable threshold can be used
to sense and limit currents in either the positive or
negative supply lines.
1
•
•
•
Equally Usable for Either Positive or Negative
Regulator Design
Adjustable Low Threshold Current Sense
Amplifier
Undervoltage and Overvoltage Fault Alert With
Programmable Delay
2 Applications
•
•
•
•
•
Wireless LAN
In addition, the UC1834-DIE has a fault monitoring
circuit which senses both undervoltage and
overvoltage fault conditions. After a user defined
delay for transient rejection, this circuitry provides a
fault alert output for either fault condition. In the
overvoltage case, a crowbar output is activated. An
overvoltage latch maintains the crowbar output and
can be used to shutdown the driver outputs. System
control to the device can be accommodated at a
single input, which will act as both a supply reset and
remote shutdown terminal. These die are protected
against excessive power dissipation by an internal
thermal shutdown function.
Programmable Logic Controller
Motor Control and Drives
Solar Energy Systems
Sonar, Ultrasound
Ordering Information(1)
PACKAGE
PRODUCT
PACKAGE
ORDERABLE PART NUMBER
PACKAGE QUANTITY
DESIGNATOR
UC1834VTD1
UC1834VTD2
80
10
UC1834
TD
Bare die in waffle pack(2)
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
(2) Processing is per the Texas Instruments space production baseline and is in compliance with the Texas Instruments Quality Control
System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room temperature
only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not warranted. Visual
Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.