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UC1834VTD1 PDF预览

UC1834VTD1

更新时间: 2024-11-05 01:10:31
品牌 Logo 应用领域
德州仪器 - TI /
页数 文件大小 规格书
6页 199K
描述
High Efficiency Linear Regulator

UC1834VTD1 数据手册

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UC1834-DIE  
SLOS898 NOVEMBER 2014  
UC1834-DIE High Efficiency Linear Regulator  
1 Features  
3 Description  
The UC1834-DIE integrated circuit is optimized for  
the design of low input-output differential linear  
regulator. A high-gain amplifier and sink or source  
drive outputs facilitate high-output current designs,  
which use an external pass device. With both positive  
and negative precision references, either polarity of  
regulator can be implemented. A current sense  
amplifier with a low, adjustable threshold can be used  
to sense and limit currents in either the positive or  
negative supply lines.  
1
Equally Usable for Either Positive or Negative  
Regulator Design  
Adjustable Low Threshold Current Sense  
Amplifier  
Undervoltage and Overvoltage Fault Alert With  
Programmable Delay  
2 Applications  
Wireless LAN  
In addition, the UC1834-DIE has a fault monitoring  
circuit which senses both undervoltage and  
overvoltage fault conditions. After a user defined  
delay for transient rejection, this circuitry provides a  
fault alert output for either fault condition. In the  
overvoltage case, a crowbar output is activated. An  
overvoltage latch maintains the crowbar output and  
can be used to shutdown the driver outputs. System  
control to the device can be accommodated at a  
single input, which will act as both a supply reset and  
remote shutdown terminal. These die are protected  
against excessive power dissipation by an internal  
thermal shutdown function.  
Programmable Logic Controller  
Motor Control and Drives  
Solar Energy Systems  
Sonar, Ultrasound  
Ordering Information(1)  
PACKAGE  
PRODUCT  
PACKAGE  
ORDERABLE PART NUMBER  
PACKAGE QUANTITY  
DESIGNATOR  
UC1834VTD1  
UC1834VTD2  
80  
10  
UC1834  
TD  
Bare die in waffle pack(2)  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
website at www.ti.com.  
(2) Processing is per the Texas Instruments space production baseline and is in compliance with the Texas Instruments Quality Control  
System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room temperature  
only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not warranted. Visual  
Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.  
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,  
intellectual property matters and other important disclaimers. PRODUCTION DATA.  

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