TPS54350-EP
6
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www.ti.com
SGLS308–OCTOBER 2005
4.5-V TO 20-V INPUT, 3-A OUTPUT SYNCHRONOUS PWM
SWITCHER WITH INTEGRATED FET (SWIFT™)
FEATURES
APPLICATIONS
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Industrial & Commercial Low Power Systems
LCD Monitors and TVs
Computer Peripherals
Point of Load Regulation for High
Performance DSPs, FPGAs, ASICs, and
Microprocessors
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Controlled Baseline
– One Assembly/Test Site, One Fabrication
Site
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Extended Temperature Performance of -55°C
to 125°C
Enhanced Diminishing Manufacturing
Sources (DMS) Support
DESCRIPTION
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Enhanced Product-Change Notification
The TPS54350 is
a
medium output current
(1)
Qualification Pedigree
synchronous buck PWM converter with an integrated
high side MOSFET and a gate driver for an optional
low side external MOSFET. Features include a high
performance voltage error amplifier that enables
maximum performance under transient conditions
and flexibility in choosing the output filter inductors
100 mW, 4.5-A Peak MOSFET Switch for High
Efficiency at 3-A Continuous Output Current
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Uses External Lowside MOSFET or Diode
Output Voltage Adjustable Down to 0.891 V
With 2% Accuracy
and
capacitors.
The
TPS54350
has
an
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Synchronizes to External Clock
under-voltage-lockout circuit to prevent start-up until
the input voltage reaches 4.5 V; an internal slow-start
circuit to limit in-rush currents; and a power good
output to indicate valid output conditions. The
synchronization feature is configurable as either an
input or an output for easy 180° out of phase
synchronization.
180° Out of Phase Synchronization
Wide PWM Frequency – Fixed 250 kHz,
500 kHz or Adjustable 250 kHz to 700 kHz
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Internal Slow Start
Load Protected by Peak Current Limit and
Thermal Shutdown
The TPS54350 device is available in a thermally
enhanced 16-pin TSSOP (PWP) PowerPAD™
package. Texas Instruments provides evaluation
modules and the SWIFT™ designer software tool to
aid in quickly achieving high-performance power
supply designs to meet aggressive equipment
development cycles.
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Adjustable Undervoltage Lockout
16-Pin TSSOP PowerPAD™ Package
(1) Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
performance and environmental limits.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PowerPAD, SWIFT are trademarks of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Copyright © 2005, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.