TMS470R1A64
16/32-Bit RISC Flash Microcontroller
www.ti.com
SPNS099–NOVEMBER 2004
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High-Performance Static CMOS Technology
• Asynchronous/Isosynchronous Modes
– Standard CAN Controller (SCC)
– 16-Mailbox Capacity
TMS470R1x 16/32-Bit RISC Core
(ARM7TDMI™)
– 24-MHz System Clock (48-MHz Pipeline
Mode)
• Fully Compliant With CAN Protocol, Version
2.0B
– Independent 16/32-Bit Instruction Set
– Open Architecture With Third-Party Support
– Built-In Debug Module
– Class II Serial Interface (C2SIa)
• Two Selectable Data Rates
• Normal Mode 10.4 Kbps and 4X Mode 41.6
– Big-Endian Format Utilized
Kbps
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Integrated Memory
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High-End Timer (HET)
– 64K-Byte Program Flash
– 13 Programmable I/O Channels:
• 12 High-Resolution Pins
• One Bank With Five Contiguous Sectors
• Internal State Machine for Programming
and Erase
• 1 Standard-Resolution Pin
– High-Resolution Share Feature (XOR)
– HET RAM (64-Instruction Capacity)
– 4K-Byte Static RAM (SRAM)
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Operating Features
10-Bit Multi-Buffered ADC (MibADC)
8-Channel
– Core Supply Voltage (VCC): 1.71 V–2.05 V
– I/O Supply Voltage (VCCIO): 3.0 V–3.6 V
– Low-Power Modes: STANDBY and HALT
– Industrial Temperature Ranges
470+ System Module
– 64-Word FIFO Buffer
– Single- or Continuous-Conversion Modes
– 1.55 µs Minimum Sample and Conversion
Time
– Calibration Mode and Self-Test Features
Six External Interrupts
– 32-Bit Address Space Decoding
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– Bus Supervision for Memory and
Peripherals
Flexible Interrupt Handling
– Analog Watchdog (AWD) Timer
– Real-Time Interrupt (RTI)
5 Dedicated General-Purpose I/O (GIO) Pins, 1
Input-Only GIO Pin, and 34 Additional
Peripheral I/Os
– System Integrity and Failure Detection
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External Clock Prescale (ECP) Module
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Zero-Pin Phase-Locked Loop (ZPLL)-Based
Clock Module With Prescaler
– Programmable Low-Frequency External
Clock (CLK)
– Multiply-by-4 or -8 Internal ZPLL Option
– ZPLL Bypass Mode
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On-Chip Scan-Base Emulation Logic, IEEE
Standard 1149.1 (1) (JTAG) Test-Access Port
Six Communication Interfaces:
80-Pin Plastic Low-Profile Quad Flatpack (PN
Suffix)
– Two Serial Peripheral Interfaces (SPIs)
• 255 Programmable Baud Rates
– Two Serial Communication Interfaces (SCIs)
• 224 Selectable Baud Rates
(1) The test-access port is compatible with the IEEE Standard
1149.1-1990, IEEE Standard Test-Access Port and Boundary
Scan Architecture specification. Boundary scan is not sup-
ported on this device.
ARM7TDMI is a trademark of Advanced RISC Machines (ARM) Limited.
ADVANCE INFORMATION concerns new products in the sampling
or preproduction phase of development. Characteristic data and
other specifications are subject to change without notice.
Copyright © 2004, Texas Instruments Incorporated