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TM2EJ64EPN-50 PDF预览

TM2EJ64EPN-50

更新时间: 2024-02-13 07:00:59
品牌 Logo 应用领域
德州仪器 - TI 动态存储器内存集成电路
页数 文件大小 规格书
20页 276K
描述
2MX64 EDO DRAM MODULE, 50ns, DMA144, DIMM-144

TM2EJ64EPN-50 技术参数

生命周期:Obsolete零件包装代码:DIMM
包装说明:DIMM, DIMM144,32针数:144
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8542.32.00.02风险等级:5.84
访问模式:FAST PAGE WITH EDO最长访问时间:50 ns
其他特性:RAS ONLY/CAS BEFORE RAS/HIDDEN REFRESHI/O 类型:COMMON
JESD-30 代码:R-XDMA-N144内存密度:134217728 bit
内存集成电路类型:EDO DRAM MODULE内存宽度:64
功能数量:1端口数量:1
端子数量:144字数:2097152 words
字数代码:2000000工作模式:ASYNCHRONOUS
最高工作温度:70 °C最低工作温度:
组织:2MX64输出特性:3-STATE
封装主体材料:UNSPECIFIED封装代码:DIMM
封装等效代码:DIMM144,32封装形状:RECTANGULAR
封装形式:MICROELECTRONIC ASSEMBLY电源:3.3 V
认证状态:Not Qualified刷新周期:4096
自我刷新:NO最大待机电流:0.008 A
子类别:DRAMs最大压摆率:0.8 mA
最大供电电压 (Vsup):3.6 V最小供电电压 (Vsup):3 V
标称供电电压 (Vsup):3.3 V表面贴装:NO
技术:MOS温度等级:COMMERCIAL
端子形式:NO LEAD端子节距:0.8 mm
端子位置:DUALBase Number Matches:1

TM2EJ64EPN-50 数据手册

 浏览型号TM2EJ64EPN-50的Datasheet PDF文件第3页浏览型号TM2EJ64EPN-50的Datasheet PDF文件第4页浏览型号TM2EJ64EPN-50的Datasheet PDF文件第5页浏览型号TM2EJ64EPN-50的Datasheet PDF文件第7页浏览型号TM2EJ64EPN-50的Datasheet PDF文件第8页浏览型号TM2EJ64EPN-50的Datasheet PDF文件第9页 
TM2EJ64DPN, TM2FJ64DPN 2097152 BY 64-BIT  
TM2EJ64EPN, TM2FJ64EPN 2097152 BY 64-BIT  
EXTENDED-DATA-OUT DYNAMIC RAM MODULES — SODIMM  
SMMS685 – AUGUST 1997  
electrical characteristics over recommended ranges of supply voltage and ambient temperature  
(unless otherwise noted)  
TM2EJ64DPN  
’2EJ64DPN-50  
’2EJ64DPN-60  
’2EJ64DPN-70  
PARAMETER  
UNIT  
V
TEST CONDITIONS  
MIN  
MAX  
MIN  
MAX  
MIN  
MAX  
I
I
I
I
= – 2 mA  
= – 100 µA  
= 2 mA  
LVTTL  
2.4  
2.4  
2.4  
High-level output  
voltage  
OH  
OH  
OL  
OL  
V
V
OH  
LVCMOS  
LVTTL  
V
0.2  
V
0.2  
V
0.2  
DD  
DD  
DD  
0.4  
0.2  
0.4  
0.2  
0.4  
0.2  
Low-level output  
voltage  
V
OL  
= 100 µA  
LVCMOS  
Input current  
(leakage)  
V
= 3.6 V,  
V = 0 V to 3.9 V,  
I
DD  
DD  
All others = 0 V to V  
I
I
± 10  
± 10  
± 10  
± 10  
± 10  
± 10  
µA  
µA  
I
Output current  
(leakage)  
V
= 3.6 V,  
V
= 0 V to V ,  
DD  
DD  
CASx high  
O
O
Read- or  
write-cycle  
current  
‡§  
I
V
V
= 3.6 V,  
Minimum cycle  
960  
16  
8
800  
16  
8
720  
16  
8
mA  
mA  
mA  
CC1  
DD  
= 2 V (LVTTL),  
IH  
After one memory cycle,  
RAS0 and CASx high  
I
Standby current  
CC2  
V
IH  
= V  
– 0.2 V (LVCMOS),  
DD  
After one memory cycle,  
RAS0 and CASx high  
Average refresh  
current  
(RAS-only  
V
= 3.6 V,  
Minimum cycle,  
DD  
RAS0 cycling,  
‡§  
‡¶  
I
I
960  
880  
800  
720  
720  
640  
mA  
mA  
CC3  
CASx high (RAS-only refresh),  
RAS0 low after CASx low (CBR)  
refresh or CBR)  
Average EDO  
current  
V
= 3.6 V,  
t
= MIN,  
DD  
RAS0 low,  
HPC  
CASx cycling  
CC4  
For conditions shown as MIN/MAX, use the appropriate value specified in the timing requirements.  
Measured with outputs open  
§
Measured with a maximum of one address change while RAS0 = V  
IL  
Measured with a maximum of one address change during each EDO cycle, t  
HPC  
6
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443  

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