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TLV27L2CDG4 PDF预览

TLV27L2CDG4

更新时间： 2024-11-01 15:54:39
品牌 Logo 应用领域
德州仪器 - TI 放大器信息通信管理光电二极管
页数 文件大小 规格书
17页 477K
描述
IC,OP-AMP,DUAL,BICMOS,SOP,8PIN,PLASTIC

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TLV27L2CDG4 技术参数

是否Rohs认证： 符合生命周期：Obsolete
包装说明：SOP, SOP8,.25Reach Compliance Code：unknown
风险等级：5.84放大器类型：OPERATIONAL AMPLIFIER
架构：VOLTAGE-FEEDBACK25C 时的最大偏置电流 (IIB)：0.00006 µA
频率补偿：YES最大输入失调电压：7000 µV
JESD-30 代码：R-PDSO-G8低-偏置：YES
低-失调：NO微功率：YES
功能数量：2端子数量：8
最高工作温度：70 °C最低工作温度：
封装主体材料：PLASTIC/EPOXY封装代码：SOP
封装等效代码：SOP8,.25封装形状：RECTANGULAR
封装形式：SMALL OUTLINE包装方法：TUBE
功率：NO电源：+-1.35/+-8/2.7/16 V
可编程功率：NO认证状态：Not Qualified
子类别：Operational Amplifiers最大压摆率：0.032 mA
供电电压上限：16.5 V表面贴装：YES
技术：BICMOS温度等级：COMMERCIAL
端子形式：GULL WING端子节距：1.27 mm
端子位置：DUAL最小电压增益：5000
宽带：NOBase Number Matches：1

TLV27L2CDG4 数据手册

 浏览型号TLV27L2CDG4的Datasheet PDF文件第2页浏览型号TLV27L2CDG4的Datasheet PDF文件第3页浏览型号TLV27L2CDG4的Datasheet PDF文件第4页浏览型号TLV27L2CDG4的Datasheet PDF文件第5页浏览型号TLV27L2CDG4的Datasheet PDF文件第6页浏览型号TLV27L2CDG4的Datasheet PDF文件第7页 
TLV27L1  
TLV27L2  
SLOS378A – SEPTEMBER 2001 – REVISED JULY 2003  
FAMILY OF MICROPOWER RAIL-TO-RAIL OUTPUT  
OPERATIONAL AMPLIFIERS  
FEATURES  
DESCRIPTION  
D
D
D
D
D
D
D
D
BiMOS Rail-to-Rail Output  
The TLV27Lx single supply operational amplifiers  
Input Bias Current . . . 1 pA  
provide rail-to-rail output capability. The TLV27Lx takes  
the minimum operating supply voltage down to 2.7 V  
over the extended industrial temperature range, while  
adding the rail-to-rail output swing feature. The  
TLV27Lx also provides 160-kHz bandwidth from only  
7 µA. The maximum recommended supply voltage is  
16 V, which allows the devices to be operated from  
( 8-V supplies down to 1.35 V) two rechargeable cells.  
High Wide Bandwidth . . . 160 kHz  
High Slew Rate . . . 0.1 V/µs  
Supply Current . . . 7 µA (per channel)  
Input Noise Voltage . . . 89 nV/√Hz  
Supply Voltage Range . . . 2.7 V to 16 V  
Specified Temperature Range  
– –40°C to 125°C . . . Industrial Grade  
– 0°C to 70°C . . . Commercial Grade  
Ultra-Small Packaging  
– 5 Pin SOT-23 (TLV27L1)  
The rail-to-rail outputs make the TLV27Lx good  
upgrades for the TLC27Lx family—offering more  
bandwidth at a lower quiescent current. The TLV27Lx  
offset voltage is equal to that of the TLC27LxA variant.  
Their cost effectiveness makes them a good alternative  
to the TLC/V225x, where offset and noise are not of  
premium importance.  
D
APPLICATIONS  
D
D
D
D
Portable Medical  
The TLV27L1/2 are available in the commercial  
temperature range to enable easy migration from the  
equivalent TLC27Lx. The TLV27L1 is not available with  
the power saving/performance boosting programmable  
pin 8.  
Power Monitoring  
Low Power Security Detection Systems  
Smoke Detectors  
The TLV27L1 is available in the small SOT-23 package  
—something the TLC27(L)1 was not—enabling  
performance boosting in a smaller package. The  
TLV27L2 is available in the 3mm x 5mm MSOP,  
providing PCB area savings over the 8-pin SOIC and  
8-pin TSSOP.  
SELECTION GUIDE  
V
[V]  
I
/ch  
V
ICR  
[V]  
V
[mV]  
I
IB  
[pA]  
GBW  
[MHz]  
SLEW RATE  
V , 1 kHz  
n
[nV/√Hz]  
S
Q
IO  
DEVICE  
[µA]  
[V/µs]  
TLV27Lx  
TLV238x  
TLC27Lx  
OPAx349  
OPAx347  
TLC225x  
2.7 to 16  
2.7 to 16  
4 to 16  
11  
–0.2 to V +1.2  
5
60  
0.18  
0.18  
0.06  
0.06  
0.03  
0.02  
0.01  
0.02  
89  
S
10  
–0.2 to V –0.2  
4.5  
60  
90  
S
17  
–0.2 to V –1.5  
10/5/2  
10  
60  
0.085  
0.070  
0.35  
68  
S
1.8 to 5.5  
2.3 to 5.5  
2.7 to 16  
2
–0.2 to V +0.2  
10  
300  
60  
S
34  
–0.2 to V +0.2  
6
10  
S
62.5  
0 to V –1.5  
1.5/0.85  
60  
0.200  
19  
S
NOTE: All dc specs are maximums while ac specs are typicals.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
Copyright 2001–2003, Texas Instruments Incorporated  
1
www.ti.com  
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