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TLP190B_07 PDF预览

TLP190B_07

更新时间: 2024-11-18 03:59:27
品牌 Logo 应用领域
东芝 - TOSHIBA 光电二极管光电二极管
页数 文件大小 规格书
5页 167K
描述
Photocoupler GaAГAs Ired & Photo−Diode Array

TLP190B_07 数据手册

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TLP190B  
TOSHIBA Photocoupler GaAAs Ired & PhotoDiode Array  
TLP190B  
Telecommunication  
Unit in mm  
Programmable Controllers  
MOS Gate Driver  
MOS FET Gate Driver  
The TOSHIBA mini flat coupler TLP190B is a small outline coupler,  
suitable for surface mount assembly.  
The TLP190B consists of a GaAAs light emitting diode, optically  
coupled to a series connected photo diode array which is suitable for  
MOS FET gate drive.  
Open voltage: 7.0V (min.)  
Short current: 12.0μA (min.)  
Isolation voltage: 2500Vrms (min.)  
UL recognized: UL1577, file no. E67349  
TOSHIBA  
114C1  
Weight: 0.09 g  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Symbol  
Rating  
50  
Unit  
mA  
Pin Configuration (top view)  
Forward current  
I
F
6
1
Forward current  
derating (Ta 25°C)  
ΔI / °C  
F
0.5  
mA / °C  
LED  
Pulse forward current  
(100μs pulse 100pps)  
I
1
A
FP  
3
4
Reverse voltage  
V
3
125  
V
R
Junction temperature  
Forward current  
T
°C  
μA  
V
j
1. Anode  
I
50  
FD  
3. Cathode  
4. Cathode  
6. Anode  
Detector  
Reverse voltage  
V
10  
RD  
Junction temperature  
T
125  
°C  
°C  
°C  
°C  
j
Storage temperature range  
T
55~125  
40~85  
260  
stg  
opr  
Operating temperature range  
Lead soldering temperature (10 s)  
T
T
sol  
BV  
Isolation voltage  
(AC, 1 min., R.H. 60%)  
2500  
Vrms  
S
(Note)  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
(Note) Device considered a two terminal device: Pins 1 and 3 shorted together and pins 4 and 6 shorted together.  
1
2007-10-01  

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