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TK70X04K3(TE24L) PDF预览

TK70X04K3(TE24L)

更新时间: 2024-11-12 20:10:11
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
9页 222K
描述
TRANSISTOR,MOSFET,N-CHANNEL,40V V(BR)DSS,70A I(D),SMT

TK70X04K3(TE24L) 技术参数

是否Rohs认证: 不符合生命周期:Not Recommended
包装说明:,Reach Compliance Code:unknown
风险等级:5.84配置:Single
最大漏极电流 (Abs) (ID):70 AFET 技术:METAL-OXIDE SEMICONDUCTOR
工作模式:ENHANCEMENT MODE最高工作温度:175 °C
极性/信道类型:N-CHANNEL最大功率耗散 (Abs):80 W
子类别:FET General Purpose Power表面贴装:YES
Base Number Matches:1

TK70X04K3(TE24L) 数据手册

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TK70X04K3  
MOSFETs Silicon N-channel MOS (U-MOS )  
TK70X04K3  
1. Applications  
Motor Drivers  
DC-DC Converters  
Switching Voltage Regulators  
2. Features  
(1) Low drain-source on-resistance: RDS(ON) = 3.7 m(typ.) (VGS = 10 V)  
(2) Low leakage current: IDSS = 10 µA (max) (VDS = 40 V)  
(3) Enhancement mode: Vth = 3.0 to 4.0 V (VDS = 10 V, ID = 1 mA)  
3. Packaging and Internal Circuit  
1: Gate :G  
2: N.C.  
3: Source :S  
4: Drain :D  
TFP  
4. Absolute Maximum Ratings (Note) (Ta = 25unless otherwise specified)  
Characteristics  
Symbol  
Rating  
Unit  
V
Drain-source voltage  
Gate-source voltage  
Drain current (DC)  
Drain current (pulsed)  
Power dissipation  
VDSS  
VGSS  
ID  
40  
±20  
(Note 1)  
(Note 1)  
70  
A
IDP  
210  
(Tc = 25)  
PD  
80  
W
mJ  
A
Single-pulse avalanche energy  
Avalanche current  
(Note 2)  
EAS  
IAR  
80  
70  
Channel temperature  
Storage temperature  
(Note 3)  
(Note 3)  
Tch  
Tstg  
175  
-55 to 175  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
2011-09-02  
Rev.1.0  
1

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