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TJ120F06J3(TE24L,Q) PDF预览

TJ120F06J3(TE24L,Q)

更新时间: 2024-11-08 10:27:19
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
7页 217K
描述
TRANSISTOR,MOSFET,P-CHANNEL,60V V(BR)DSS,120A I(D),TO-263ABVAR

TJ120F06J3(TE24L,Q) 数据手册

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TJ120F06J3  
TOSHIBA Field Effect Transistor Silicon P Channel MOS Type (U-MOS)  
TJ120F06J3  
Chopper Regulator, DC-DC Converter Applications  
Unit: mm  
Motor Drive Applications  
10.0 ± 0.3  
9.5 ± 0.2  
0.4 ± 0.1  
Low drain-source ON resistance: R  
= 5.5 mΩ (typ.)  
DS (ON)  
High forward transfer admittance: |Y | = 110 S (typ.)  
fs  
Low leakage current: I  
= 10 μA (max) (V  
= 60 V)  
DSS  
DS  
1.1  
Enhancement-model: V = 1.5 to 3.0 V (V  
= 10 V, I = 1 mA)  
D
th  
DS  
0.76 ± 0.1  
1.4 ± 0.1  
2.35 ± 0.1  
0.4 ± 0.1  
Absolute Maximum Ratings (Ta = 25°C)  
2.54 ± 0.25  
2.34 ± 0.25  
1
2
3
Characteristics  
Drain-source voltage  
Symbol  
Rating  
Unit  
V
60  
60  
V
V
V
DSS  
Drain-gate voltage (R  
Gate-source voltage  
= 20 kΩ)  
V
GS  
DGR  
V
±20  
GSS  
1. GATE  
2. DRAIN  
HEAT SINK)  
DC  
(Note 1)  
I
120  
360  
300  
D
3. SOURSE  
Drain current  
A
8.0  
Pulse (Note 1)  
I
DP  
Drain power dissipation (Tc = 25°C)  
P
W
D
AS  
AR  
JEDEC  
JEITA  
Single pulse avalanche energy  
E
608  
mJ  
(Note 2)  
TOSHIBA  
2-10W1A  
Avalanche current  
I
120  
30  
A
Weight: 1.07 g (typ.)  
Repetitive avalanche energy (Note 3)  
Channel temperature (Note 4)  
Storage temperature range (Note 4)  
E
mJ  
°C  
°C  
AR  
T
175  
ch  
2
T
55 to 175  
stg  
1
Thermal Characteristics  
Characteristics  
Symbol  
Max  
0.5  
Unit  
3
Thermal resistance, channel to case  
R
°C/W  
th (ch-c)  
Note 1: Please use devises on condition that the channel temperature is below 175°C.  
Note 2: = −25 V, T = 25°C (Initial), L = 57 μH, R = 25 Ω, I = −120 A  
Note 3: Repetitive rating; pulse width limited by maximum channel temperature.  
V
DD  
ch  
G
AR  
Note 4: The definitions of the absolute maximum channel temperature and storage temperatures are based on  
AEC-Q101.  
Note 5: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly  
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute  
maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
This transistor is an electrostatic sensitive device. Please handle with caution  
1
2009-04-17  

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