TJ120F06J3
TOSHIBA Field Effect Transistor Silicon P Channel MOS Type (U-MOSⅢ)
TJ120F06J3
Chopper Regulator, DC-DC Converter Applications
Unit: mm
Motor Drive Applications
10.0 ± 0.3
9.5 ± 0.2
0.4 ± 0.1
•
•
•
•
Low drain-source ON resistance: R
= 5.5 mΩ (typ.)
DS (ON)
High forward transfer admittance: |Y | = 110 S (typ.)
fs
Low leakage current: I
= −10 μA (max) (V
= −60 V)
DSS
DS
1.1
Enhancement-model: V = −1.5 to −3.0 V (V
= −10 V, I = −1 mA)
D
th
DS
0.76 ± 0.1
1.4 ± 0.1
2.35 ± 0.1
0.4 ± 0.1
Absolute Maximum Ratings (Ta = 25°C)
2.54 ± 0.25
2.34 ± 0.25
1
2
3
Characteristics
Drain-source voltage
Symbol
Rating
Unit
V
−60
−60
V
V
V
DSS
Drain-gate voltage (R
Gate-source voltage
= 20 kΩ)
V
GS
DGR
V
±20
GSS
1. GATE
2. DRAIN
(HEAT SINK)
DC
(Note 1)
I
−120
−360
300
D
3. SOURSE
Drain current
A
8.0
Pulse (Note 1)
I
DP
Drain power dissipation (Tc = 25°C)
P
W
D
AS
AR
JEDEC
JEITA
⎯
⎯
Single pulse avalanche energy
E
608
mJ
(Note 2)
TOSHIBA
2-10W1A
Avalanche current
I
−120
30
A
Weight: 1.07 g (typ.)
Repetitive avalanche energy (Note 3)
Channel temperature (Note 4)
Storage temperature range (Note 4)
E
mJ
°C
°C
AR
T
175
ch
2
T
−55 to 175
stg
1
Thermal Characteristics
Characteristics
Symbol
Max
0.5
Unit
3
Thermal resistance, channel to case
R
°C/W
th (ch-c)
Note 1: Please use devises on condition that the channel temperature is below 175°C.
Note 2: = −25 V, T = 25°C (Initial), L = 57 μH, R = 25 Ω, I = −120 A
Note 3: Repetitive rating; pulse width limited by maximum channel temperature.
V
DD
ch
G
AR
Note 4: The definitions of the absolute maximum channel temperature and storage temperatures are based on
AEC-Q101.
Note 5: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
This transistor is an electrostatic sensitive device. Please handle with caution
1
2009-04-17