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TC7WHU04FK_09 PDF预览

TC7WHU04FK_09

更新时间: 2024-11-16 12:22:59
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
7页 181K
描述
Triple Inverter(Un-Buffer)

TC7WHU04FK_09 数据手册

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TC7WHU04FU/FK  
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic  
TC7WHU04FU,TC7WHU04FK  
Triple Inverter(Un-Buffer)  
Features  
TC7WHU04FU  
High speed: t = 3.5 ns (typ.) at V  
= 5 V, C = 15pF  
pd  
CC L  
Low power dissipation: I  
= 2 μA (max) at Ta = 25°C  
CC  
High noise immunity: V  
5.5-V Tolerant inputs.  
= V  
= 10% V  
(min)  
NIH  
NIL  
CC  
Wide operating voltage range: V  
= 2to5.5 V  
CC  
Balanced propagation delays :t  
t  
pHL  
pLH  
Identical pin assignment and function with TC7WU04  
(SM8)  
TC7WHU04FK  
Marking  
SM8  
US8  
Product Name  
Lot No.  
H U 0 4  
W H  
U04  
(US8)  
Weight  
SSOP8-P-0.65: 0.02 g (typ.)  
SSOP8-P-0.50A: 0.01 g (typ.)  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Supply voltage  
Symbol  
Rating  
Unit  
V
0.5 to 7.0  
0.5 to 7.0  
V
CC  
Pin Assignment (top view)  
DC input voltage  
V
V
IN  
DC output voltage  
Input diode current  
Output diode current  
DC output current  
V
0.5 to V  
+ 0.5  
V
OUT  
CC  
I
20  
mA  
mA  
mA  
mA  
IK  
1A  
3Y  
1
2
3
4
8
7
6
5
V
CC  
I
±20(Note1)  
±25  
OK  
1Y  
3A  
Y2  
I
OUT  
2A  
DC V /ground current  
CC  
I
±50  
CC  
GND  
300 (SM8)  
200 (US8)  
65 to 150  
260  
Power dissipation  
P
mW  
D
Storage temperature  
T
°C  
°C  
stg  
Lead temperature (10 s)  
T
L
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if  
the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings and the operating ranges.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report  
and estimated failure rate, etc).  
Note1: VOUT<GND,VOUT>VCC  
1
2009-09-29  

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