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TC7SET00FU(T5LTR,F PDF预览

TC7SET00FU(T5LTR,F

更新时间: 2024-11-11 15:53:59
品牌 Logo 应用领域
东芝 - TOSHIBA 输入元件光电二极管逻辑集成电路
页数 文件大小 规格书
7页 194K
描述
AHCT/VHCT/VT SERIES, 2-INPUT NAND GATE, PDSO5

TC7SET00FU(T5LTR,F 技术参数

生命周期:Active包装说明:TSSOP,
Reach Compliance Code:unknownHTS代码:8542.39.00.01
风险等级:5.68系列:AHCT/VHCT/VT
JESD-30 代码:R-PDSO-G5长度:2 mm
逻辑集成电路类型:NAND GATE功能数量:1
输入次数:2端子数量:5
最高工作温度:85 °C最低工作温度:-40 °C
封装主体材料:PLASTIC/EPOXY封装代码:TSSOP
封装形状:RECTANGULAR封装形式:SMALL OUTLINE, THIN PROFILE, SHRINK PITCH
传播延迟(tpd):10.3 ns座面最大高度:1.1 mm
最大供电电压 (Vsup):5.5 V最小供电电压 (Vsup):4.5 V
标称供电电压 (Vsup):5 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子形式:GULL WING端子节距:0.65 mm
端子位置:DUAL宽度:1.25 mm
Base Number Matches:1

TC7SET00FU(T5LTR,F 数据手册

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TC7SET00F/FU  
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic  
TC7SET00F, TC7SET00FU  
2 Input NAND Gate  
Features  
TC7SET00F  
High Speed : t = 4.2ns (typ.) at V  
= 5 V, C = 15pF  
pd  
CC L  
Low Power Dissipation : I  
= 2μA (max) at Ta = 25°C  
CC  
Compatible with TTL outputs  
: V = 0.8 V (max)  
IL  
V
= 2.0 V (min)  
IH  
5.5-V tolerant inputs.  
Balanced Propagation Delays : t  
t  
pHL  
pLH  
(SMV)  
TC7SET00FU  
Marking  
Product Name  
(USV)  
G 1  
Weight  
SSOP5-P-0.95  
SSOP5-P-0.65A  
: 0.016 g (typ.)  
: 0.006 g (typ.)  
Absolute Maximum Ratings (Ta = 25°C)  
Pin Assignment (top view)  
Characteristics  
Supply voltage  
Symbol  
Rating  
Unit  
V
V
0.5 to 7.0  
0.5 to 7.0  
CC  
DC input voltage  
V
V
5
4
V
CC  
IN B  
IN A  
GND  
1
2
3
IN  
DC output voltage  
Input diode current  
Output diode current  
DC output current  
V
0.5 to V +0.5  
V
OUT  
CC  
I
20  
±20 (Note 1)  
±25  
mA  
mA  
mA  
mA  
mW  
°C  
IK  
I
OK  
I
OUT  
OUT Y  
DC V /ground current  
CC  
I
±50  
CC  
Power dissipation  
P
200  
D
Storage temperature  
Lead temperature (10s)  
T
65 to 150  
260  
stg  
T
°C  
L
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings and the operating ranges.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Note 1: VOUT < GND, VOUT > VCC  
Start of commercial production  
1996-09  
1
2014-03-01  

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