SN54HC27, SN74HC27
TRIPLE 3-INPUT POSITIVE-NOR GATES
SCLS088D – DECEMBER 1982 – REVISED AUGUST 2003
Wide Operating Voltage Range of 2 V to 6 V
Outputs Can Drive Up To 10 LSTTL Loads
Typical t = 9 ns
pd
4-mA Output Drive at 5 V
Low Power Consumption, 20-µA Max I
Low Input Current of 1 µA Max
CC
SN54HC27 . . . FK PACKAGE
(TOP VIEW)
SN54HC27 . . . J OR W PACKAGE
SN74HC27 . . . D, DB, N, OR NS PACKAGE
(TOP VIEW)
1A
1B
V
CC
1C
1Y
1
2
3
4
5
6
7
14
13
12
3
2
1
20 19
18
1Y
NC
3C
2A
NC
2B
4
5
6
7
8
2A
17
16
2B
11 3C
10
9
2C
3B
3A
3Y
15 NC
14
9 10 11 12 13
NC
2C
2Y
3B
8
GND
NC – No internal connection
description/ordering information
The ’HC27 devices contain three independent 3-input NOR gates. They perform the Boolean function
Y = A + B + C or Y = A • B • C in positive logic.
ORDERING INFORMATION
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
†
PACKAGE
T
A
PDIP – N
SOIC – D
Tube of 25
Tube of 50
Reel of 2500
Reel of 250
Reel of 2000
Reel of 2000
Tube of 25
Tube of 150
Tube of 55
SN74HC27N
SN74HC27N
SN74HC27D
SN74HC27DR
SN74HC27DT
SN74HC27NSR
SN74HC27DBR
SNJ54HC27J
SNJ54HC27W
SNJ54HC27FK
HC27
–40°C to 85°C
SOP – NS
SSOP – DB
CDIP – J
HC27
HC27
SNJ54HC27J
SNJ54HC27W
SNJ54HC27FK
–55°C to 125°C
CFP – W
LCCC – FK
†
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are
available at www.ti.com/sc/package.
FUNCTION TABLE
(each gate)
INPUTS
OUTPUT
Y
A
H
X
X
L
B
X
H
X
L
C
X
X
H
L
L
L
L
H
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright 2003, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
1
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