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SN74AHC08MDREP PDF预览

SN74AHC08MDREP

更新时间: 2024-11-04 12:22:47
品牌 Logo 应用领域
德州仪器 - TI 输入元件
页数 文件大小 规格书
10页 436K
描述
QUADRUPLE 2-INPUT POSITIVE-AND GATE

SN74AHC08MDREP 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Active零件包装代码:SOIC
包装说明:SOP, SOP14,.25针数:14
Reach Compliance Code:compliantECCN代码:EAR99
HTS代码:8542.39.00.01Factory Lead Time:1 week
风险等级:0.86系列:AHC/VHC/H/U/V
JESD-30 代码:R-PDSO-G14JESD-609代码:e4
长度:8.65 mm负载电容(CL):50 pF
逻辑集成电路类型:AND GATE最大I(ol):0.008 A
湿度敏感等级:1功能数量:4
输入次数:2端子数量:14
最高工作温度:125 °C最低工作温度:-55 °C
封装主体材料:PLASTIC/EPOXY封装代码:SOP
封装等效代码:SOP14,.25封装形状:RECTANGULAR
封装形式:SMALL OUTLINE包装方法:TR
峰值回流温度(摄氏度):260电源:2/5.5 V
最大电源电流(ICC):0.02 mAProp。Delay @ Nom-Sup:9 ns
传播延迟(tpd):14 ns认证状态:Not Qualified
施密特触发器:NO座面最大高度:1.75 mm
子类别:Gates最大供电电压 (Vsup):5.5 V
最小供电电压 (Vsup):2 V标称供电电压 (Vsup):3.3 V
表面贴装:YES技术:CMOS
温度等级:MILITARY端子面层:Nickel/Palladium/Gold (Ni/Pd/Au)
端子形式:GULL WING端子节距:1.27 mm
端子位置:DUAL处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:3.9 mm

SN74AHC08MDREP 数据手册

 浏览型号SN74AHC08MDREP的Datasheet PDF文件第2页浏览型号SN74AHC08MDREP的Datasheet PDF文件第3页浏览型号SN74AHC08MDREP的Datasheet PDF文件第4页浏览型号SN74AHC08MDREP的Datasheet PDF文件第5页浏览型号SN74AHC08MDREP的Datasheet PDF文件第6页浏览型号SN74AHC08MDREP的Datasheet PDF文件第7页 
SN74AHC08-EP  
QUADRUPLE 2-INPUT POSITIVE-AND GATE  
SCLS484 – JUNE 2003  
D OR PW PACKAGE  
(TOP VIEW)  
Controlled Baseline  
– One Assembly/Test Site, One Fabrication  
Site  
1A  
1B  
V
CC  
13 4B  
1
2
3
4
5
6
7
14  
Extended Temperature Performance of  
–55°C to 125°C  
12  
11  
10  
9
1Y  
4A  
4Y  
3B  
3A  
3Y  
Enhanced Diminishing Manufacturing  
Sources (DMS) Support  
2A  
2B  
Enhanced Product-Change Notification  
2Y  
8
Qualification Pedigree  
GND  
Operating Range 2-V to 5.5-V V  
CC  
EPIC (Enhanced-Performance Implanted  
CMOS) Process  
Latch-Up Performance Exceeds 250 mA  
Per JESD 17  
ESD Protection Exceeds 2000 V Per  
MIL-STD-883, Method 3015; Exceeds 200 V  
Using Machine Model (C = 200 pF, R = 0)  
Component qualification in accordance with JEDEC and industry  
standards to ensure reliable operation over an extended  
temperature range. This includes, but is not limited to, Highly  
Accelerated Stress Test (HAST) or biased 85/85, temperature  
cycle, autoclave or unbiased HAST, electromigration, bond  
intermetallic life, and mold compound life. Such qualification  
testing should not be viewed as justifying use of this component  
beyond specified performance and environmental limits.  
description/ordering information  
This device is  
A B or Y  
a
quadruple 2-input positive-AND gate that performs the Boolean function  
Y
A B in positive logic.  
ORDERING INFORMATION  
ORDERABLE  
PART NUMBER  
TOP-SIDE  
MARKING  
PACKAGE  
T
A
SOIC – D  
Tape and reel  
Tape and reel  
SN74AHC08MDREP  
SN74AHC08MPWREP  
AHC08MEP  
AHC08EP  
–55°C to 125°C  
TSSOP – PW  
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design  
guidelines are available at www.ti.com/sc/package.  
FUNCTION TABLE  
(each gate)  
INPUTS  
OUTPUT  
Y
A
B
H
X
L
H
L
H
L
L
X
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
EPIC is a trademark of Texas Instruments.  
Copyright 2003, Texas Instruments Incorporated  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  

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