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SN74AHC08-EP_14 PDF预览

SN74AHC08-EP_14

更新时间： 2024-11-17 02:58:47
品牌 Logo 应用领域
德州仪器 - TI 输入元件
页数 文件大小 规格书
10页 436K
描述
QUADRUPLE 2-INPUT POSITIVE-AND GATE

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SN74AHC08-EP_14 数据手册

 浏览型号SN74AHC08-EP_14的Datasheet PDF文件第2页浏览型号SN74AHC08-EP_14的Datasheet PDF文件第3页浏览型号SN74AHC08-EP_14的Datasheet PDF文件第4页浏览型号SN74AHC08-EP_14的Datasheet PDF文件第5页浏览型号SN74AHC08-EP_14的Datasheet PDF文件第6页浏览型号SN74AHC08-EP_14的Datasheet PDF文件第7页 
SN74AHC08-EP  
QUADRUPLE 2-INPUT POSITIVE-AND GATE  
SCLS484 – JUNE 2003  
D OR PW PACKAGE  
(TOP VIEW)  
Controlled Baseline  
– One Assembly/Test Site, One Fabrication  
Site  
1A  
1B  
V
CC  
13 4B  
1
2
3
4
5
6
7
14  
Extended Temperature Performance of  
–55°C to 125°C  
12  
11  
10  
9
1Y  
4A  
4Y  
3B  
3A  
3Y  
Enhanced Diminishing Manufacturing  
Sources (DMS) Support  
2A  
2B  
Enhanced Product-Change Notification  
2Y  
†
8
Qualification Pedigree  
GND  
Operating Range 2-V to 5.5-V V  
CC  
EPIC (Enhanced-Performance Implanted  
CMOS) Process  
Latch-Up Performance Exceeds 250 mA  
Per JESD 17  
ESD Protection Exceeds 2000 V Per  
MIL-STD-883, Method 3015; Exceeds 200 V  
Using Machine Model (C = 200 pF, R = 0)  
†
Component qualification in accordance with JEDEC and industry  
standards to ensure reliable operation over an extended  
temperature range. This includes, but is not limited to, Highly  
Accelerated Stress Test (HAST) or biased 85/85, temperature  
cycle, autoclave or unbiased HAST, electromigration, bond  
intermetallic life, and mold compound life. Such qualification  
testing should not be viewed as justifying use of this component  
beyond specified performance and environmental limits.  
description/ordering information  
This device is  
A • B or Y  
a
quadruple 2-input positive-AND gate that performs the Boolean function  
Y
A B in positive logic.  
ORDERING INFORMATION  
ORDERABLE  
PART NUMBER  
TOP-SIDE  
MARKING  
‡
PACKAGE  
T
A
SOIC – D  
Tape and reel  
Tape and reel  
SN74AHC08MDREP  
SN74AHC08MPWREP  
AHC08MEP  
AHC08EP  
–55°C to 125°C  
TSSOP – PW  
‡
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design  
guidelines are available at www.ti.com/sc/package.  
FUNCTION TABLE  
(each gate)  
INPUTS  
OUTPUT  
Y
A
B
H
X
L
H
L
H
L
L
X
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
EPIC is a trademark of Texas Instruments.  
Copyright 2003, Texas Instruments Incorporated  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265  
1234567...10

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