Datasheet > SN65HVD230Q-Q1

SN65HVD230Q-Q1

更新时间： 2024-11-04 22:25:15

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德州仪器 - TI		/
页数	文件大小	规格书
28页	396K
描述
3.3-V CAN TRANSCEIVERS

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数据手册

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SN65HVD230Q-Q1 数据手册

SN65HVD230Q-Q1

SN65HVD231Q-Q1

SN65HVD232Q-Q1

SGLS117C – JUNE 2001 – REVISED JUNE 2002

3.3-V CAN TRANSCEIVERS

Low-Current SN65HVD231Q Sleep Mode

0.1 µA Typical

FEATURES

†

Qualification in Accordance With AEC-Q100

Qualified for Automotive Applications

‡

Designed for Signaling Rates Up To

1 Megabit/Second (Mbps)

Customer-Specific Configuration Control Can

Be Supported Along With Major-Change

Approval

Thermal Shutdown Protection

Open-Circuit Fail-Safe Design

ESD Protection Exceeds 2000 V Per

MIL-STD-883, Method 3015; Exceeds 200 V

Using Machine Model (C = 200 pF, R = 0)

SN65HVD230QD

SN65HVD231QD

(TOP VIEW)

Operates With a 3.3-V Supply

Low Power Replacement for the PCA82C250

Footprint

GND

CANH

CANL

Bus/Pin ESD Protection Exceeds 15-kV HBM

ref

Controlled Driver Output Transition Times for

Improved Signal Quality on the SN65HVD230Q

and SN65HVD231Q

SN65HVD232QD

(TOP VIEW)

Unpowered Node Does Not Disturb the Bus

Compatible With the Requirements of the

ISO 11898 Standard

GND

CANH

CANL

Low-Current SN65HVD230Q Standby Mode

370 µA Typical

†

Contact factory for details. Q100 qualification data available on

request.

NC – No internal connection

logic diagram (positive logic)

SN65HVD230Q, SN65HVD231Q

Logic Diagram (Positive Logic)

SN65HVD232Q

Logic Diagram (Positive Logic)

ref

CANH

CANL

CANH

CANL

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments

semiconductor products and disclaimers thereto appears at the end of this data sheet.

‡

The signaling rate of a line is the number of voltage transitions that are made per second expressed in the units bps (bits per second).

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.

www.ti.com

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