生命周期: | Active | 包装说明: | , |
Reach Compliance Code: | compliant | ECCN代码: | EAR99 |
HTS代码: | 8542.32.00.51 | 风险等级: | 5.8 |
最长访问时间: | 45 ns | 其他特性: | HARDWARE DATA PROTECTION; DATA RETENTION 10 YEARS; 1M PROGRAM/ERASE CYCLES |
数据保留时间-最小值: | 10 | JESD-30 代码: | X-XXMA-X22 |
内存密度: | 16777216 bit | 内存集成电路类型: | FLASH CARD |
内存宽度: | 8 | 功能数量: | 1 |
端子数量: | 22 | 字数: | 2097152 words |
字数代码: | 2000000 | 工作模式: | ASYNCHRONOUS |
最高工作温度: | 55 °C | 最低工作温度: | |
组织: | 2MX8 | 封装主体材料: | UNSPECIFIED |
封装形状: | UNSPECIFIED | 封装形式: | MICROELECTRONIC ASSEMBLY |
并行/串行: | PARALLEL | 编程电压: | 5 V |
认证状态: | Not Qualified | 最大供电电压 (Vsup): | 5.5 V |
最小供电电压 (Vsup): | 4.5 V | 标称供电电压 (Vsup): | 5 V |
表面贴装: | NO | 技术: | CMOS |
温度等级: | COMMERCIAL | 端子形式: | UNSPECIFIED |
端子位置: | UNSPECIFIED | Base Number Matches: | 1 |
型号 | 品牌 | 获取价格 | 描述 | 数据表 |
SMFR-29C516E-31 | MICROCHIP |
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Error Detection And Correction Circuit, CMOS Series, 16-Bit, True Output, CMOS, PQFP100 | |
SMFR-29C516E-31 | ATMEL |
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Error Detection And Correction Circuit, CMOS Series, 16-Bit, True Output, CMOS, PQFP100, L | |
SMFR-29C516E-31 | TEMIC |
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Error Detection And Correction Circuit, CMOS Series, 16-Bit, CMOS, PQFP100, MQFP-100 | |
SMFR-29C516E-31/883 | TEMIC |
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Error Detection And Correction Circuit, CMOS Series, 16-Bit, CMOS, PQFP100, MQFP-100 | |
SMFR-29C516E-31HXXX | ATMEL |
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Error Detection And Correction Circuit, CMOS Series, 16-Bit, CMOS, PQFP100, L LEAD, MQFP-1 | |
SMFR-29C516E-31P883 | MICROCHIP |
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Error Detection And Correction Circuit, CMOS Series, 16-Bit, True Output, CMOS, PQFP100 | |
SMFR-29C516E-31SB | ATMEL |
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16 Bit Flow Through EDAC Error Detection And Correction unit | |
SMFR-29C516E-31SB | MICROCHIP |
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Error Detection And Correction Circuit, CMOS Series, 16-Bit, True Output, CMOS, PQFP100 | |
SMFR-29C516E-31SC | MICROCHIP |
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Error Detection And Correction Circuit, CMOS Series, 16-Bit, True Output, CMOS, PQFP100 | |
SMFR-29C516ESB | TEMIC |
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Error Detection And Correction Circuit, 16-Bit, CMOS, MQFP-100 |