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S29CD016G0JDEI004 PDF预览

S29CD016G0JDEI004

更新时间: 2024-11-07 15:50:15
品牌 Logo 应用领域
飞索 - SPANSION 内存集成电路
页数 文件大小 规格书
15页 437K
描述
Flash, 512KX32, 67ns, 7.44 X 4.46 MM, DIE-76

S29CD016G0JDEI004 技术参数

生命周期:Obsolete零件包装代码:DIE
包装说明:7.44 X 4.46 MM, DIE-76针数:76
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8542.32.00.51风险等级:5.24
最长访问时间:67 ns其他特性:SYNCHRONOUS BURST MODE OPERATION ALSO POSSIBLE
启动块:BOTTOM/TOPJESD-30 代码:R-XUUC-N76
内存密度:16777216 bit内存集成电路类型:FLASH
内存宽度:32功能数量:1
端子数量:76字数:524288 words
字数代码:512000工作模式:ASYNCHRONOUS
最高工作温度:85 °C最低工作温度:-40 °C
组织:512KX32封装主体材料:UNSPECIFIED
封装代码:DIE封装形状:RECTANGULAR
封装形式:UNCASED CHIP并行/串行:PARALLEL
编程电压:2.7 V认证状态:Not Qualified
最大供电电压 (Vsup):2.75 V最小供电电压 (Vsup):2.5 V
标称供电电压 (Vsup):2.6 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子形式:NO LEAD端子位置:UPPER
类型:NOR TYPEBase Number Matches:1

S29CD016G0JDEI004 数据手册

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S29CD016G Known Good Die  
16 Megabit (512 K x 32-Bit) CMOS 2.5 Volt-only  
Burst Mode, Dual Boot, Simultaneous Read/Write  
Flash Memory  
Data Sheet Supplement  
Distinctive Characteristics  
„ Versatile I/O™ control  
Architecture Advantages  
— Device generates data output voltages and tolerates  
data input voltages as determined by the voltage on  
the VIO pin  
„ Simultaneous Read/Write operations  
— Data can be continuously read from the 75% bank  
while executing erase/program functions in the 25%  
bank  
— Zero latency between read and write operations  
Two bank architecture: 75%/25%  
— 1.65 V to 2.75 V compatible I/O signals  
— 3.6 V tolerant I/O signals  
Software Features  
„ Persistent Sector Protection  
„ User-Defined x32 Data Bus  
„ Dual Boot Block  
— A command sector protection method to lock  
combinations of individual sectors and sector groups  
to prevent program or erase operations within that  
sector (requires only VCC levels)  
Top and bottom boot in the same device  
„ Flexible sector architecture  
— Eight 8 Kbytes, thirty 64 Kbytes, and eight 8 Kbytes  
sectors  
„ Password Sector Protection  
„ Manufactured on 0.17 µm process technology  
„ SecSi (Secured Silicon) Sector (256 Bytes)  
— A sophisticated sector protection method to lock  
combinations of individual sectors and sector groups  
to prevent program or erase operations within that  
sector using a user-definable 64-bit password  
Factory locked and identifiable: 16 bytes for secure,  
random factory Electronic Serial Number; remainder  
may be customer data programmed by Spansion  
Customer lockable: Can be read, programmed or  
erased just like other sectors. Once locked, data  
cannot be changed  
„ Supports Common Flash Interface (CFI)  
„ Unlock Bypass Program Command  
— Reduces overall programming time when issuing  
multiple program command sequences  
„ Programmable Burst interface  
„ Data# Polling and toggle bits  
— Interface to any high performance processor  
— Modes of Burst Read Operation:  
Linear Burst: 4 double words and 8 double words  
with wrap around  
— Provides a software method of detecting program or  
erase operation completion  
Hardware Features  
„ Program Suspend/Resume & Erase Suspend/  
„ Single power supply operation  
— Optimized for 2.5 to 2.75 Volt read, erase, and  
program operations  
Resume  
— Suspends program or erase operations to allow  
reading, programming, or erasing in same bank  
„ Compatibility with JEDEC standards (JC42.4)  
— Software compatible with single-power supply Flash  
— Backward-compatible with Spansion Am29LV and  
Am29F, and Fujitsu MBM29LV and MBM29F flash  
memories  
„ Hardware Reset (RESET#), Ready/Busy#  
(RY/BY#), and Write Protect (WP#) inputs  
„ ACC input  
— Accelerates programming time for higher throughput  
during system production  
Performance Characteristics  
„ High performance read access  
„ Quality and reliability levels equivalent to  
standard packaged components  
— Initial/random access times as fast as 64 ns  
— Burst access time as fast as 10 ns  
„ Ultra low power consumption  
— Burst Mode Read: 90 mA @ 56 MHz max  
— Program/Erase: 50 mA max  
— Standby mode: CMOS: 150 µA max  
„ 1 million write cycles per sector typical  
„ 20 year data retention typical  
Publication Number S29CD016G_KGD Revision A Amendment 1 Issue Date October 21, 2005  

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