Datasheet > S29AL004D90DGE027

S29AL004D90DGE027

更新时间： 2025-08-15 06:20:31

品牌	Logo	应用领域
飞索 - SPANSION		/
页数	文件大小	规格书
13页	244K
描述
Flash, 256KX16, 90ns, 3.90 X 2.33 MM, DIE

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S29AL004D90DGE027 数据手册

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S29AL004D Known Good Die

4 Megabit (512K x 8-Bit/256 K x 16-Bit)

CMOS 3.0 Volt-only, Boot Sector Flash Memory

Data Sheet Supplement

Distinctive Characteristics

Single power supply operation

Embedded Algorithms

—

2.7 to 3.6 V for read, program, and erase operations

—

Embedded Erase algorithm automatically

preprograms and erases the entire chip or any

combination of designated sectors

Manufactured on 0.20µm process technology

High performance

—

Embedded Program algorithm automatically writes

and verifies data at specified addresses

—

Access times as fast as 70 ns

Ultra low power consumption (typical values

Minimum one million write cycle guarantee

per sector

Compatibility with JEDEC standards

at 5 MHz)

—

200 nA Automatic Sleep mode current

200 nA standby mode current

9 mA read current

—

Pinout and software compatible with single-power

supply Flash

20 mA program/erase current

—

Superior inadvertent write protection

Flexible sector architecture

Data# Polling and toggle bits

—

One 16 Kbyte, two 8 Kbyte, one 32 Kbyte, and seven

64 Kbyte sectors (byte mode)

—

Provides a software method of detecting program or

erase operation completion

—

One 8 Kword, two 4 Kword, one 16 Kword, and seven

32 Kword sectors (word mode)

Ready/Busy# pin (RY/BY#)

—

Provides a hardware method of detecting program or

erase cycle completion

—

Supports full chip erase

Sector Protection features:

Erase Suspend/Erase Resume

A hardware method of locking a sector to

prevent any program or erase operations

within that sector

—

Suspends an erase operation to read data from, or

program data to, a sector that is not being erased,

then resumes the erase operation

—

Sectors can be locked in-system or via programming

equipment

Hardware reset pin (RESET#)

—

Temporary Sector Unprotect feature allows code

changes in previously locked sectors

—

Hardware method to reset the device to reading array

data

20-year data retention at 125°C

Unlock Bypass Program Command

—

Reduces overall programming time when issuing

multiple program command sequences

—

Reliable operation for the life of the system

Tested to data sheet specifications at

Top or bottom boot block configurations

temperature

available

Quality and reliability levels equivalent to

standard packaged components

Publication Number S29AL004D_KGD Revision A Amendment 2 Issue Date April 14, 2006

12 3 4 5 6 7...13

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与S29AL004D90DGE027相关器件

型号	品牌	获取价格	描述	数据表
S29AL004D90DGI014	SPANSION	获取价格	Flash, 256KX16, 90ns, DIE
S29AL004D90DGI027	SPANSION	获取价格	Flash, 256KX16, 90ns, DIE
S29AL004D90DGV017	SPANSION	获取价格	Flash, 256KX16, 90ns, DIE
S29AL004D90DHC014	SPANSION	获取价格	Flash, 256KX16, 90ns, 3.90 X 2.33 MM, DIE
S29AL004D90DHC017	SPANSION	获取价格	Flash, 256KX16, 90ns, 3.90 X 2.33 MM, DIE
S29AL004D90DHC024	SPANSION	获取价格	Flash, 256KX16, 90ns, 3.90 X 2.33 MM, DIE
S29AL004D90DHC027	SPANSION	获取价格	Flash, 256KX16, 90ns, 3.90 X 2.33 MM, DIE
S29AL004D90DHE017	SPANSION	获取价格	Flash, 256KX16, 90ns, 3.90 X 2.33 MM, DIE
S29AL004D90DHE027	SPANSION	获取价格	Flash, 256KX16, 90ns, 3.90 X 2.33 MM, DIE
S29AL004D90DHI027	SPANSION	获取价格	Flash, 256KX16, 90ns, DIE

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