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S27KS0641DPBHV023 PDF预览

S27KS0641DPBHV023

更新时间: 2024-11-26 01:12:31
品牌 Logo 应用领域
赛普拉斯 - CYPRESS 动态存储器内存集成电路
页数 文件大小 规格书
29页 770K
描述
HyperRAM™ Self-Refresh DRAM 3.0V/1.8V 64 Mb (8 MB)

S27KS0641DPBHV023 技术参数

是否Rohs认证: 符合生命周期:Active
包装说明:VBGA,Reach Compliance Code:compliant
HTS代码:8542.31.00.01风险等级:5.57
JESD-30 代码:R-PBGA-B24长度:8 mm
内存密度:67108864 bit内存集成电路类型:MEMORY CIRCUIT
内存宽度:8功能数量:1
端子数量:24字数:8388608 words
字数代码:8000000工作模式:SYNCHRONOUS
最高工作温度:105 °C最低工作温度:-40 °C
组织:8MX8封装主体材料:PLASTIC/EPOXY
封装代码:VBGA封装形状:RECTANGULAR
封装形式:GRID ARRAY, VERY THIN PROFILE峰值回流温度(摄氏度):NOT SPECIFIED
座面最大高度:1 mm最大供电电压 (Vsup):1.95 V
最小供电电压 (Vsup):1.7 V标称供电电压 (Vsup):1.8 V
表面贴装:YES技术:CMOS
温度等级:INDUSTRIAL端子形式:BALL
端子节距:1 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:6 mm
Base Number Matches:1

S27KS0641DPBHV023 数据手册

 浏览型号S27KS0641DPBHV023的Datasheet PDF文件第2页浏览型号S27KS0641DPBHV023的Datasheet PDF文件第3页浏览型号S27KS0641DPBHV023的Datasheet PDF文件第4页浏览型号S27KS0641DPBHV023的Datasheet PDF文件第5页浏览型号S27KS0641DPBHV023的Datasheet PDF文件第6页浏览型号S27KS0641DPBHV023的Datasheet PDF文件第7页 
ADVANCE  
S27KL0641, S27KS0641  
HyperRAMSelf-Refresh DRAM  
3.0V/1.8V 64 Mb (8 MB)  
Distinctive Characteristics  
HyperBus™ Low Signal Count Interface  
High Performance  
3.0V I/O, 11 bus signals  
– Single ended clock (CK)  
1.8V I/O, 12 bus signals  
– Differential clock (CK, CK#)  
Chip Select (CS#)  
Up to 333MB/s  
Double-Data Rate (DDR) - two data transfers per clock  
166-MHz clock rate (333 MB/s) at 1.8V VCC  
100-MHz clock rate (200 MB/s) at 3.0V VCC  
Sequential burst transactions  
Configurable Burst Characteristics  
– Wrapped burst lengths:  
8-bit data bus (DQ[7:0])  
Read-Write Data Strobe (RWDS)  
– Bidirectional Data Strobe / Mask  
– 16 bytes (8 clocks)  
– Output at the start of all transactions to indicate refresh  
latency  
– 32 bytes (16 clocks)  
– 64 bytes (32 clocks)  
– Output during read transactions as Read Data Strobe  
– Input during write transactions as Write Data Mask  
– 128 bytes (64 clocks)  
– Linear burst  
– Hybrid option - one wrapped burst followed by linear burst  
– Wrapped or linear burst type selected in each transaction  
– Configurable output drive strength  
Package and Die Options  
RESET#  
V
CC  
V
Q
CC  
CS#  
CK  
DQ[7:0]  
RWDS  
– 24-ball FBGA footprint  
CK#  
V
SS  
V
Q
SS  
Performance Summary  
Read Transaction Timings  
Maximum Current Consumption  
Maximum Clock Rate at 1.8V VCC/VCC  
Maximum Clock Rate at 3.0V VCC/VCC  
Q
Q
166 MHz  
100 MHz  
36 ns  
Burst Read or Write (linear burst at 166 MHz, 1.8V) 60 mA  
Power On Reset  
50 mA  
300 µA  
40 µA  
Maximum Access Time, (tACC at 166 MHz)  
Standby (CS# = High, 3V, 105 °C)  
Deep Power Down (CS# = High, 3V, 105 °C)  
Standby (CS# = High, 1.8V, 105 °C)  
Deep Power Down (CS# = High, 1.8V, 105 °C)  
Maximum CS# Access Time to first word at  
166 MHz (excluding refresh latency)  
56 ns  
300 µA  
20 µA  
Errata: For information on silicon errata, see "Errata” on page 27. Details include trigger conditions, devices affected, and proposed workaround.  
Cypress Semiconductor Corporation  
Document Number: 001-97964 Rev. *E  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised March 01, 2016  

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