RU40C40M
Electrical Characteristics (TA=25°C Unless Otherwise Noted)
RU40C40M
Symbol
Parameter
Test Condition
Unit
V
Min. Typ. Max.
Static Characteristics
VGS=0V, IDS=250µA
N
P
40
-40
1
BVDSS
Drain-Source Breakdown Voltage
Zero Gate Voltage Drain Current
VGS=0V, IDS=-250µA
VDS=40V, VGS=0V
N
P
TJ=125°C
VDS=-40V, VGS=0V
TJ=125°C
30
-1
IDSS
µA
-30
VDS=VGS, IDS=250µA
VDS=VGS, IDS=-250µA
VGS=±20V, VDS=0V
VGS=±20V, VDS=0V
VGS=10V, IDS=20A
VGS=-10V, IDS=-20A
VGS=4.5V, IDS=16A
VGS=-4.5V, IDS=-16A
N
P
N
P
N
P
N
P
1
2.5
-2.5
±1
VGS(th)
Gate Threshold Voltage
Gate Leakage Current
V
-1
IGSS
µA
±10
16
12
21
17
30
25
⑤
Drain-Source On-state Resistance
mΩ
RDS(ON)
22
35
Diode Characteristics
ISD=20A, VGS=0V
ISD=-20A, VGS=0V
N
P
N
1.2
⑤
Diode Forward Voltage
V
VSD
-1.3
N-Channel
ISD=20A, dlSD/dt=100A/µs
15
36
31
26
t
rr
Reverse Recovery Time
ns
P
N
P
P-Channel
ISD=-20A, dlSD/dt=100A/µs
Q
rr
Reverse Recovery Charge
nC
⑥
Dynamic Characteristics
N
P
N
P
N
P
N
P
1.2
1.5
RG
Ciss
Coss
Crss
VGS=0V,VDS=0V,F=1MHz
Gate Resistance
Ω
880
1900
170
245
70
N-Channel
VGS=0V,VDS=20V,
Frequency=1.0MHz
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
pF
P-Channel
VGS=0V,VDS=-20V,
Frequency=1.0MHz
135
Shenzhen City Ruichips Semiconductor Co., Ltd
Rev. A– JAN., 2017
2
www.ruichips.com