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RN2504(TE85L,F) PDF预览

RN2504(TE85L,F)

更新时间: 2024-11-15 14:44:31
品牌 Logo 应用领域
东芝 - TOSHIBA 晶体管
页数 文件大小 规格书
7页 472K
描述
PRE-BIASED "DIGITAL" TRANSISTOR,50V V(BR)CEO,100MA I(C),SOT-25

RN2504(TE85L,F) 技术参数

是否Rohs认证:符合生命周期:Active
包装说明:,Reach Compliance Code:unknown
风险等级:5.76Is Samacsys:N
最大集电极电流 (IC):0.1 A最小直流电流增益 (hFE):80
元件数量:2极性/信道类型:PNP
最大功率耗散 (Abs):0.3 W子类别:BIP General Purpose Small Signal
表面贴装:YES晶体管元件材料:SILICON
Base Number Matches:1

RN2504(TE85L,F) 数据手册

 浏览型号RN2504(TE85L,F)的Datasheet PDF文件第2页浏览型号RN2504(TE85L,F)的Datasheet PDF文件第3页浏览型号RN2504(TE85L,F)的Datasheet PDF文件第4页浏览型号RN2504(TE85L,F)的Datasheet PDF文件第5页浏览型号RN2504(TE85L,F)的Datasheet PDF文件第6页浏览型号RN2504(TE85L,F)的Datasheet PDF文件第7页 
RN2501~RN2506  
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process) (Bias Resistor built-in Transistor)  
RN2501, RN2502, RN2503  
RN2504, RN2505, RN2506  
Unit: mm  
Switching, Inverter Circuit, Interface Circuit  
and Driver Circuit Applications  
z Including two devices in SMV (super mini type with 5 leads)  
z With built-in bias resistors  
z Simplify circuit design  
z Reduce a quantity of parts and manufacturing process  
z Complementary to RN1501 to RN1506  
Equivalent Circuit and Bias Resistor Values  
Type No.  
R1 (k)  
R2 (k)  
RN2501  
RN2502  
RN2503  
RN2504  
RN2505  
RN2506  
4.7  
10  
4.7  
10  
22  
47  
47  
47  
SMV  
JEDEC  
22  
JEITA  
47  
TOSHIBA  
Weight: 14 mg (typ.)  
2-3L1A  
2.2  
4.7  
Absolute Maximum Ratings (Ta = 25°C) (Q1, Q2 Common)  
Equivalent Circuit  
(Top View)  
Characteristic  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
V
50  
50  
V
V
CBO  
CEO  
RN2501 to 2506  
Collector-emitter voltage  
RN2501 to 2504  
RN2505, 2506  
10  
Emitter base voltage  
V
V
EBO  
5  
Collector current  
I
100  
300  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P *  
C
RN2501 to 2506  
Tj  
150  
Tstg  
55 to150  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if  
the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
*Total rating  
Start of commercial production  
1988-10  
1
2014-03-01  

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