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RN2408(TE85L,F) PDF预览

RN2408(TE85L,F)

更新时间: 2024-11-13 15:49:47
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
6页 346K
描述
Small Signal Bipolar Transistor

RN2408(TE85L,F) 技术参数

生命周期:Active包装说明:,
Reach Compliance Code:unknown风险等级:5.78
Base Number Matches:1

RN2408(TE85L,F) 数据手册

 浏览型号RN2408(TE85L,F)的Datasheet PDF文件第2页浏览型号RN2408(TE85L,F)的Datasheet PDF文件第3页浏览型号RN2408(TE85L,F)的Datasheet PDF文件第4页浏览型号RN2408(TE85L,F)的Datasheet PDF文件第5页浏览型号RN2408(TE85L,F)的Datasheet PDF文件第6页 
RN2407~RN2409  
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process) (Bias Resistor built-in Transistor)  
RN2407, RN2408, RN2409  
Unit: mm  
Switching, Inverter Circuit, Interface Circuit  
and Driver Circuit Applications  
z With built-in bias resistors  
z Simplified circuit design  
z Reduce a quantity of parts and manufacturing process  
z Complementary to RN1407 to 1409  
Equivalent Circuit and Bias Resistor Values  
Type No.  
R1 (k)  
R2 (k)  
RN2407  
RN2408  
RN2409  
10  
22  
47  
47  
47  
22  
JEDEC  
JEITA  
TO-236MOD  
SC-59  
TOSHIBA  
2-3F1A  
Weight: 12mg (typ.)  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Symbol  
Rating  
Unit  
Collector-base voltage  
V
V
50  
50  
V
V
CBO  
CEO  
RN2407 to RN2409  
Collector-emitter voltage  
Emitter-base voltage  
RN2407  
RN2408  
RN2409  
6  
V
V
7  
EBO  
15  
Collector current  
I
100  
200  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
C
RN2407 to RN2409  
T
150  
j
T
stg  
55 to 150  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Start of commercial production  
1985-05  
1
2014-03-01  

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