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PIC18F4680-IPT

更新时间: 2024-11-08 12:36:07
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描述
PIC18F2585/2680/4585/4680 Rev. A1 Silicon Errata

PIC18F4680-IPT 数据手册

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PIC18F2585/2680/4585/4680  
PIC18F2585/2680/4585/4680 Rev. A1 Silicon Errata  
The PIC18F2585/2680/4585/4680 Rev. A1 parts you  
have received conform functionally to the Device Data  
Sheet (DS39625C), except for the anomalies  
described below. Any Data Sheet Clarification issues  
related to the PIC18F2585/2680/4585/4680 will be  
reported in a separate Data Sheet errata. Please check  
the Microchip web site for any existing issues.  
2. Module: ECCP  
When a shutdown condition occurs, the output port  
is made inactive for the duration of the event. After  
the event that caused the shutdown ends, the  
ECCP module immediately enables the PWM out-  
put and does not wait until the beginning of the  
next PWM cycle.  
All of the issues listed here will be addressed in future  
revisions of the PIC18F2585/2680/4585/4680 silicon.  
Work around  
Disable the auto-restart feature in software, poll  
the Timer2 Interrupt Flag (TMR2IF) and do not  
clear the ECCPASE bit until TMR2IF is set.  
The following silicon errata apply only to  
PIC18F2585/2680/4585/4680 devices with these  
Device/Revision IDs:  
Date Codes that pertain to this issue:  
Part Number  
Device ID  
Revision ID  
All engineering and production devices.  
PIC18F2585  
PIC18F2680  
PIC18F4585  
PIC18F4680  
0001 1010 100  
0001 1010 110  
0001 1010 101  
0001 1010 111  
0 0010  
0 0010  
0 0010  
0 0010  
3. Module: ECCP  
ECCP1, configured for auto-shutdown with  
Comparator 1, corrupts the PWM duty cycle pulse.  
In addition, it does not consistently synchronize  
the pulse to the beginning of the period, and the  
end of the pulse can occur at any time within the  
period.  
The Device IDs (DEVID1 and DEVID2) are located at  
addresses 3FFFFEh:3FFFFFh in the device’s  
configuration space. They are shown in binary in the  
format “DEVID2 DEVID1”.  
Work around  
1. Module: ECCP  
None.  
When monitoring a shutdown condition using a bit  
test on the ECCPASE bit (ECCP1AS<7>) or  
performing a bit operation on the ECCPASE bit,  
the device may produce unexpected results.  
Date Codes that pertain to this issue:  
All engineering and production devices.  
4. Module: ECCP  
Work around  
The auto-shutdown event will cause the ECCP  
pins (P1A, P1B, P1C, P1D) to draw higher current  
than expected. This occurs when the ECCPAS1 or  
ECCPAS0 bits are set and an auto-shutdown  
event occurs.  
Before performing a bit test or bit operation on the  
ECCPASE bit, copy the ECCP1AS register to the  
working register and perform the test or operation  
there.  
By avoiding these operations on the ECCPASE bit  
in the ECCP1AS register, the module will operate  
normally.  
Work around  
None.  
In Example 1, ECCPASE bit operations are  
performed on the W register.  
Date Codes that pertain to this issue:  
All engineering and production devices.  
EXAMPLE 1:  
MOVF  
BTFSC WREG, ECCPASE  
BRA SHUTDOWN_ROUTINE  
ECCP1AS, W  
Date Codes that pertain to this issue:  
All engineering and production devices.  
© 2007 Microchip Technology Inc.  
DS80202G-page 1  

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