NSI1200C
Datasheet (EN)1.0
Parameters
Symbol
Min
Typ
Max
Unit
Comments
VDD1 step to 3.0 V with VDD2 ≥ 3.0
V, to OUTP, OUTN valid, 0.1%
settling
Analog setting time
tAS
0.5
ms
(1) The typical value includes one standard deviation (sigma) range under typical operating conditions.
(2) The temperature drift is calculated with the whole temperature range (-40℃to 125℃).
(3) Nonlinearity is defined as half of the peak-peak value of the deviation between the measuring point and the fitting curve
divided by the full-scale range of the output voltage.
(4) THD is defined as the ratio of the sum of the rms value of first nine higher harmonics to the amplitude of the fundamental.
(5) Input referred.
6.2. Typical Performance Characteristics
Unless otherwise noted, test at VDD1 = 5V, VDD2 = 3.3V, INN=GND1=0V, INP = -250mV to 250mV, fIN = 1kHz, BW = 10kHz.
2.88
0.12
2.87
0.1
0.08
0.06
0.04
0.02
0
2.86
2.85
2.84
2.83
2.82
2.81
2.8
IIBP(uA)
IIBN(uA)
-0.5
0
0.5
1
1.5
2
2.5
3
-40
-20
0
20
40
60
80
100
120
Templerature(℃)
Vcm(V)
Figure 6.1 Common-Mode Overvoltage Detection Level vs Temperature
Figure 6.3 Input Bias Current vs Common-Mode Voltage
0.3
-70
0.2
0.1
0
-75
-80
-85
-0.1
-90
Sample 1
Sample 2
Sample 3
-0.2
-0.3
-95
-100
-40
-20
0
20
40
60
80
100
120
-40
-20
0
20
40
60
80
100
120
Templerature(℃)
Templerature(℃)
Figure 6.2 Input Offset Voltage vs Temperature
Figure 6.4 Common-Mode Rejection Ratio vs Temperature
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