Datasheet > NIPXIE-5450

NIPXIE-5450

更新时间： 2024-11-09 05:54:03

品牌	Logo	应用领域
美国国家仪器公司 - NI		/
页数	文件大小	规格书
6页	448K
描述
Dual-channel, differential I/Q signal generation

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中文翻译

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数据手册

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NIPXIE-5450 数据手册

400 MS/s, 16-Bit I/Q Signal Generator

NI PXIe-5450 NEW!

• Dual-channel, differential I/Q

signal generation

Operating Systems

• Windows Vista/XP/2000

• 16-bit resolution, 400 MS/s

sampling rate per channel

• 98 dB close-in SFDR at 1 MHz

• 145 MHz analog bandwidth for

generating 290 MHz bandwidth RF signals

Recommended Software

• LabVIEW

• LabWindows^™/CVI

• LabVIEW SignalExpress

• Measurement Studio

•

0.15 dB flatness to 120 MHz with

digital flatness correction

Included Software

• NI-FGEN driver

• 25 ps channel-to-channel skew

• <-140 dBc/Hz phase noise density for

10 MHz tone (1 kHz offset)

• -160 dBm/Hz average noise density

• 128 or 512 MB of deep

onboard memory

• NI-FGEN Express VIs

• NI Modulation Toolkit

• NI Analog Waveform Editor

• FGEN Soft Front Panel

• LabVIEW Real-Time driver

• Continuous data streaming

>600 MB/s from host

Calibration

• 1 V_pk-pkoutput, 2 PXI slots

• Self-calibration with gain and channel

alignment; offset correction

• 1-year external calibration cycle

Overview

Signal Quality

The NI PXIe-5450 is a 16-bit, 400 MS/s, dual-channel arbitrary waveform With 16 bits of resolution, the NI PXIe-5450 achieves a close-in SFDR

generator optimized for I/Q communications signals. Each of the differential

(without harmonics) of 98 dB at 1 MHz. Including harmonics and

outputs features 98 dB of close-in spurious-free dynamic range (SFDR) at measured from DC to 200 MHz, it achieves a 1 MHz SFDR of 75 dB and

1 MHz (without harmonics), better than -140 dBc/Hz phase noise density

at 10 MHz (1 kHz offset), and less than 25 ps channel-to-channel skew.

The NI PXIe-5450 is the ideal instrument to test devices with I/Q inputs

or to serve as the baseband component of an RF vector signal generator.

It also features onboard signal processing (OSP) functions that include

pulse shaping and interpolation filters, gain and offset control, and a

numerically controlled oscillator (NCO) for frequency shifting. Common

applications include prototyping, validating, and testing of semiconductor

components and communications, radar, and electronic warfare systems.

With its NI Synchronization and Memory Core (SMC) architecture, the

NI PXIe-5450 helps you integrate mixed-signal test systems by enabling

synchronization with other instruments such as vector signal analyzers/

generators, high-speed digitizers, digital waveform analyzers/generators,

and other signal generators. You can also synchronize multiple arbitrary

waveform generators to form a phase-coherent multichannel generator

for applications such as MIMO (multiple-input, multiple-output) or

beamforming antenna schemes.

a wideband SFDR of 70 dB at 60 MHz. This ensures the dynamic range

and out-of-band performance needed to meet the stringent demands of

baseband I/Q signal generation (Figure 1).

Figure 1. With its high sample rate and resolution, the NI PXIe-5450 generates

low-distortion, high-SFDR signals over a very high bandwidth (the noise floor is

limited by the measurement device).

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