Datasheet > MMA1260EGR2

MMA1260EGR2

更新时间： 2024-02-29 18:12:47

品牌	Logo	应用领域
飞思卡尔 - FREESCALE		机械
页数	文件大小	规格书
9页	241K
描述
Low G Micromachined Accelerometer

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技术参数
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MMA1260EGR2 技术参数

是否Rohs认证：	符合	生命周期：	Transferred
零件包装代码：	SOIC	包装说明：	SOP, SOP16,.4
针数：	16	Reach Compliance Code：	unknown
ECCN代码：	EAR99	HTS代码：	8542.39.00.01
风险等级：	5.01	模拟集成电路 - 其他类型：	ANALOG CIRCUIT
JESD-30 代码：	R-PDSO-G16	JESD-609代码：	e3
长度：	10.3 mm	湿度敏感等级：	3
功能数量：	1	端子数量：	16
最高工作温度：	105 °C	最低工作温度：	-40 °C
封装主体材料：	PLASTIC/EPOXY	封装代码：	SOP
封装等效代码：	SOP16,.4	封装形状：	RECTANGULAR
封装形式：	SMALL OUTLINE	峰值回流温度（摄氏度）：	250
电源：	5 V	认证状态：	Not Qualified
座面最大高度：	3.55 mm	子类别：	Other Analog ICs
最大供电电压 (Vsup)：	5.25 V	最小供电电压 (Vsup)：	4.75 V
标称供电电压 (Vsup)：	5 V	表面贴装：	YES
技术：	CMOS	温度等级：	INDUSTRIAL
端子面层：	Matte Tin (Sn)	端子形式：	GULL WING
端子节距：	1.27 mm	端子位置：	DUAL
处于峰值回流温度下的最长时间：	30	宽度：	7.5 mm
Base Number Matches：	1

MMA1260EGR2 数据手册

PRINCIPLE OF OPERATION

The Freescale accelerometer is a surface-micromachined

SPECIAL FEATURES

integrated-circuit accelerometer.

Filtering

The device consists of a surface micromachined

capacitive sensing cell (g-cell) and a CMOS signal

conditioning ASIC contained in a single integrated circuit

package. The sensing element is sealed hermetically at the

wafer level using a bulk micromachined “cap'' wafer.

The g-cell is a mechanical structure formed from

semiconductor materials (polysilicon) using semiconductor

processes (masking and etching). It can be modeled as two

stationary plates with a moveable plate in-between. The

center plate can be deflected from its rest position by

subjecting the system to an acceleration (Figure 3).

When the center plate deflects, the distance from it to one

fixed plate will increase by the same amount that the distance

to the other plate decreases. The change in distance is a

measure of acceleration.

The g-cell plates form two back-to-back capacitors

(Figure 4). As the center plate moves with acceleration, the

distance between the plates changes and each capacitor's

value will change, (C = Aε/D). Where A is the area of the

plate, ε is the dielectric constant, and D is the distance

between the plates.

The CMOS ASIC uses switched capacitor techniques to

measure the g-cell capacitors and extract the acceleration

data from the difference between the two capacitors. The

ASIC also signal conditions and filters (switched capacitor)

the signal, providing a high level output voltage that is

ratiometric and proportional to acceleration.

The Freescale accelerometers contain an onboard 2-pole

switched capacitor filter. A Bessel implementation is used

because it provides a maximally flat delay response (linear

phase) thus preserving pulse shape integrity. Because the

filter is realized using switched capacitor techniques, there is

no requirement for external passive components (resistors

and capacitors) to set the cut-off frequency.

Self-Test

The sensor provides a self-test feature that allows the

verification of the mechanical and electrical integrity of the

accelerometer at any time before or after installation. This

feature is critical in applications such as automotive airbag

systems where system integrity must be ensured over the life

of the vehicle. A fourth “plate'' is used in the g-cell as a self-

test plate. When the user applies a logic high input to the self-

test pin, a calibrated potential is applied across the self-test

plate and the moveable plate. The resulting electrostatic

force (Fe = ¹/₂AV²/d²) causes the center plate to deflect. The

resultant deflection is measured by the accelerometer's

control ASIC and a proportional output voltage results. This

procedure assures that both the mechanical (g-cell) and

electronic sections of the accelerometer are functioning.

Status

Freescale accelerometers include fault detection circuitry

and a fault latch. The Status pin is an output from the fault

latch, OR'd with self-test, and is set high whenever the

following event occurs:

Acceleration

•

Parity of the EPROM bits becomes odd in number.

The fault latch can be reset by a rising edge on the self-test

input pin, unless one (or more) of the fault conditions

continues to exist.

Figure 3. Transducer

Physical Model

Figure 4. Equivalent

Circuit Model

MMA1260EG

Sensors

Freescale Semiconductor

1 2 345 6 7...9

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MMA1260KEG	FREESCALE	Low G Micromachined Accelerometer	获取价格
MMA1260KEGR2	FREESCALE	Low G Micromachined Accelerometer	获取价格
MMA1270D	MOTOROLA	Sensor	获取价格
MMA1270DR2	MOTOROLA	SPECIALTY ANALOG CIRCUIT, PDSO16, SOIC-16	获取价格
MMA1270EG	FREESCALE	Low G Micromachined Accelerometer	获取价格
MMA1270EGR2	FREESCALE	Low G Micromachined Accelerometer	获取价格

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