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MM54C161J/883 PDF预览

MM54C161J/883

更新时间: 2024-11-15 14:43:35
品牌 Logo 应用领域
德州仪器 - TI 逻辑集成电路触发器
页数 文件大小 规格书
5页 13K
描述
CMOS SERIES, SYN POSITIVE EDGE TRIGGERED UP BINARY COUNTER, CDIP16, DIP-16

MM54C161J/883 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
包装说明:DIP, DIP16,.3Reach Compliance Code:unknown
HTS代码:8542.39.00.01风险等级:5.81
计数方向:UP系列:CMOS
JESD-30 代码:R-GDIP-T16JESD-609代码:e0
负载/预设输入:YES逻辑集成电路类型:BINARY COUNTER
工作模式:SYNCHRONOUS功能数量:1
端子数量:16最高工作温度:125 °C
最低工作温度:-55 °C封装主体材料:CERAMIC, GLASS-SEALED
封装代码:DIP封装等效代码:DIP16,.3
封装形状:RECTANGULAR封装形式:IN-LINE
电源:5/15 V传播延迟(tpd):400 ns
认证状态:Not Qualified筛选级别:38535Q/M;38534H;883B
座面最大高度:5.08 mm子类别:Counters
最大供电电压 (Vsup):15 V最小供电电压 (Vsup):3 V
标称供电电压 (Vsup):5 V表面贴装:NO
技术:CMOS温度等级:MILITARY
端子面层:Tin/Lead (Sn/Pb)端子形式:THROUGH-HOLE
端子节距:2.54 mm端子位置:DUAL
触发器类型:POSITIVE EDGE宽度:7.62 mm
Base Number Matches:1

MM54C161J/883 数据手册

 浏览型号MM54C161J/883的Datasheet PDF文件第2页浏览型号MM54C161J/883的Datasheet PDF文件第3页浏览型号MM54C161J/883的Datasheet PDF文件第4页浏览型号MM54C161J/883的Datasheet PDF文件第5页 
MICROCIRCUIT DATA SHEET  
Original Creation Date: 10/18/95  
Last Update Date: 05/19/97  
MNMM54C161-X REV 1A0  
Last Major Revision Date: 04/02/97  
BINARY COUNTER WITH ASYNCHRONOUS CLEAR  
General Description  
These (synchronous presettable up) counters are monolithic complementary MOS (CMOS)  
integrated circuits constructed with N- and P-channel enhancement mode transistors. They  
feature an internal carry lookahead for fast counting schemes and for cascading packages  
without additional gating.  
A low level at the load input disables counting and causes the outputs to agree with the  
data input after the next positive clock edge. The clear function for the C161 is  
asynchronous and a low level at the clear inputs sets all four outputs low regardless of  
the state of the clock.  
Counting is enabled when both count enable inputs are high. Input T is fed forward to also  
enable the carry out. The carry output is a positive pulse with a duration approximately  
equal to the positive portion of QA and can be used to enable successive cascaded stages.  
Logic transitions at the enable P or T inputs can occur when the clock is high or low.  
Industry Part Number  
NS Part Numbers  
MM54C161  
MM54C161J/883  
MM54C161W/883  
Prime Die  
MM54C161  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1

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