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MM54C163W/883 PDF预览

MM54C163W/883

更新时间: 2024-02-17 23:17:47
品牌 Logo 应用领域
美国国家半导体 - NSC 逻辑集成电路触发器
页数 文件大小 规格书
7页 16K
描述
IC CMOS SERIES, SYN POSITIVE EDGE TRIGGERED 4-BIT UP BINARY COUNTER, CDFP16, Counter

MM54C163W/883 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
包装说明:DFP, FL16,.3Reach Compliance Code:unknown
风险等级:5.92计数方向:UP
JESD-30 代码:R-XDFP-F16JESD-609代码:e0
负载/预设输入:YES逻辑集成电路类型:BINARY COUNTER
工作模式:SYNCHRONOUS功能数量:1
端子数量:16最高工作温度:125 °C
最低工作温度:-55 °C封装主体材料:CERAMIC
封装代码:DFP封装等效代码:FL16,.3
封装形状:RECTANGULAR封装形式:FLATPACK
电源:5/15 V认证状态:Not Qualified
筛选级别:MIL-STD-883 Class C子类别:Counters
表面贴装:YES技术:CMOS
温度等级:MILITARY端子面层:Tin/Lead (Sn/Pb)
端子形式:FLAT端子节距:1.27 mm
端子位置:DUALBase Number Matches:1

MM54C163W/883 数据手册

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MICROCIRCUIT DATA SHEET  
Original Creation Date: 10/18/95  
Last Update Date: 05/19/97  
MNMM54C163-X REV 1A0  
Last Major Revision Date: 04/02/97  
BINARY COUNTER WITH SYNCHRONOUS CLEAR  
General Description  
These (synchronous presettable up) counters are monolithic complementary MOS (CMOS)  
integrated circuits constructed with N- and P-channel enhancement mode transistors. They  
feature an internal carry lookahead for fast counting schemes and for cascading packages  
without additional gating.  
A low level at the load input disables counting and causes the outputs to agree with the  
data input after the next positive clock edge. The clear function for the C163 is  
synchronous and a low level at the clear inputs sets all four outputs low after the next  
positive clock edge.  
Counting is enabled when both count enable inputs are high. Input T is fed forward to also  
enable the carry out. The carry output is a positive pulse with a duration approximately  
equal to the positive portion of QA and can be used to enable successive cascaded stages.  
Logic transitions at the enable P or T inputs can occur when the clock is high or low.  
Industry Part Number  
NS Part Numbers  
MM54C163  
MM54C163J/883  
MM54C163W/883  
Prime Die  
MM54C163  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1

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