Datasheet > ML22Q553

ML22Q553

更新时间： 2024-02-18 09:04:02

品牌	Logo	应用领域
罗姆 - ROHM		存储
页数	文件大小	规格书
72页	2015K
描述
存储器内置型

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技术参数
数据手册

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ML22Q553 技术参数

生命周期：	Active	Reach Compliance Code：	unknown
风险等级：	5.79	内存集成电路类型：	FLASH
编程电压：	5 V	Base Number Matches：	1

ML22Q553 数据手册

FEDL22Q553-06

ML22Q553-NNN/ML22Q553-xxx

Pin Description (2)

Initial

Attribute

Symbol I/O Attribute

Description

value^(*)

Command processing status signal output pin.

This pin outputs a “L” level during command processing.

Be sure to enter commands with the CBUSYB pin driven

at a “H” level.

Connects to a crystal or a ceramic resonator.

When using an external clock, leave this pin open.

If a crystal or a ceramic resonator is used, connect it as

close to the LSI as possible.

14 CBUSYB

Negative

digital

clk

0^(*1)

XTB

Connects to a crystal or a ceramic resonator.

A feedback resistor of around 1 MΩ is built in between this

XT pin and the XTB pin. When using an external clock,

input the clock from this pin.

If a crystal or a ceramic resonator is used, connect it as

close to the LSI as possible.

Positive

—

clk

Pin for FLASH analysis.

Should be connected to DGND.

V_PP

analog

Reset input pin.

At “L” level input, the LSI enters the initial state. After a

reset input, the entire circuit is stopped and enters a

power down state. Upon power-on, input a “L” level to

this pin. After the power supply voltage is stabilized,

drive this pin at a “H” level.

20 RESETB

Negative

digital

0^(*1)

This pin has a pull-up resistor built in.

Input pin for testing. Also acts as a Flash rewrite enable

Positive pin.

Has a pull-down resistor built in.

TESTI0

digital

(MODE)

Used as either an input pin for testing or a reset input pin

for Flash rewriting. Has a pull-down resistor built in.

TESTI1

Negative

Positive

digital

(nTRST)

Used as either an input pin for testing or a state transition

pin for Flash rewriting. Has a pull-up resistor built in.

TESTI2

(TMS)

TESTI3

(TDI)

Used as either an input pin for testing or a data input pin

for Flash rewriting. Has a pull-up resistor built in.

Used as either an input pin for testing or a clock input pin

for Flash rewriting. Has a pull-up resistor built in.

Used as either an output pin for testing or a data output

pin for Flash rewriting.

Positive

digital

TESTI4

(TCK)

TESTO

Positive

—

digital

Hi-Z

(TSO)

SPM

Output pin of the built-in speaker amplifier.

Can be configured as an AOUT amplifier output by analog

command setting.

analog

SPP

—

SPGND

SPV_DD

gnd

—

Speaker amplifier ground pin.

Speaker amplifier power supply pin.

Connect a bypass capacitor of 10µF or more between this power

pin and SPGND.

*: Indicates the initial value at reset input or during power down.

*1: “0” during reset. , “1” during power down.

6/71

1...4 5 678 9 10...72

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ML22Q553-NNNMB	ETC	4-Channel Mixing Speech Synthesis LSI	获取价格
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ML22Q563-NNNMB	ETC	4-Channel Mixing Speech Synthesis LSI	获取价格
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