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M5LV-256/104-12VNC PDF预览

M5LV-256/104-12VNC

更新时间: 2024-10-29 18:59:59
品牌 Logo 应用领域
莱迪思 - LATTICE 时钟输入元件可编程逻辑
页数 文件大小 规格书
42页 938K
描述
EE PLD, 12ns, CMOS, PQFP144, TQFP-144

M5LV-256/104-12VNC 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Obsolete零件包装代码:QFP
包装说明:LFQFP,针数:144
Reach Compliance Code:compliantECCN代码:EAR99
HTS代码:8542.39.00.01风险等级:5.84
最大时钟频率:71.4 MHzJESD-30 代码:S-PQFP-G144
长度:20 mm湿度敏感等级:3
专用输入次数:I/O 线路数量:104
端子数量:144最高工作温度:70 °C
最低工作温度:组织:0 DEDICATED INPUTS, 104 I/O
输出函数:MACROCELL封装主体材料:PLASTIC/EPOXY
封装代码:LFQFP封装形状:SQUARE
封装形式:FLATPACK, LOW PROFILE, FINE PITCH峰值回流温度(摄氏度):260
可编程逻辑类型:EE PLD传播延迟:12 ns
认证状态:Not Qualified座面最大高度:1.6 mm
最大供电电压:3.6 V最小供电电压:3 V
标称供电电压:3.3 V表面贴装:YES
技术:CMOS温度等级:COMMERCIAL
端子形式:GULL WING端子节距:0.5 mm
端子位置:QUAD处于峰值回流温度下的最长时间:40
宽度:20 mmBase Number Matches:1

M5LV-256/104-12VNC 数据手册

 浏览型号M5LV-256/104-12VNC的Datasheet PDF文件第2页浏览型号M5LV-256/104-12VNC的Datasheet PDF文件第3页浏览型号M5LV-256/104-12VNC的Datasheet PDF文件第4页浏览型号M5LV-256/104-12VNC的Datasheet PDF文件第5页浏览型号M5LV-256/104-12VNC的Datasheet PDF文件第6页浏览型号M5LV-256/104-12VNC的Datasheet PDF文件第7页 
MACH 5 CPLD Family  
Fifth Generation MACH Architecture  
FEATURES  
High logic densities and I/Os for increased logic integration  
— 128 to 512 macrocell densities  
— 68 to 256 I/Os  
Wide selection of density and I/O combinations to support most application needs  
— 6 macrocell density options  
— 7 I/O options  
— Up to 4 I/O options per macrocell density  
— Up to 5 density & I/O options for each package  
Performance features to fit system needs  
— 5.5 ns t Commercial, 7.5 ns t Industrial  
PD  
PD  
— 182 MHz f  
CNT  
— Four programmable power/speed settings per block  
Flexible architecture facilitates logic design  
— Multiple levels of switch matrices allow for performance-based routing  
— 100% routability and pin-out retention  
— Synchronous and asynchronous clocking, including dual-edge clocking  
— Asynchronous product- or sum-term set or reset  
— 16 to 64 output enables  
— Functions of up to 32 product terms  
Advanced capabilities for easy system integration  
— 3.3-V & 5-V JEDEC-compliant operations  
— IEEE 1149.1 compliant for boundary scan testing  
— 3.3-V & 5-V in-system programmable via IEEE 1149.1 Boundary Scan Test Access Port  
— PCI compliant (-5/-6/-7/-10/-12 speed grades)  
— Safe for mixed supply voltage system design  
— Bus-Friendly™ Inputs & I/Os  
— Individual output slew rate control  
— Hot socketing  
— Programmable security bit  
2
Advanced E CMOS process provides high performance, cost effective solutions  
Publication# 20446  
Amendment/0  
Rev: J  
Issue Date: April 2002  

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