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M27C256B-80XB6X PDF预览

M27C256B-80XB6X

更新时间: 2024-02-13 13:16:47
品牌 Logo 应用领域
意法半导体 - STMICROELECTRONICS 存储内存集成电路光电二极管可编程只读存储器OTP只读存储器电动程控只读存储器
页数 文件大小 规格书
16页 149K
描述
256 Kbit (32Kb x 8) UV EPROM and OTP EPROM

M27C256B-80XB6X 技术参数

是否Rohs认证: 符合生命周期:Obsolete
零件包装代码:DIP包装说明:0.600 INCH, PLASTIC, DIP-28
针数:28Reach Compliance Code:compliant
ECCN代码:EAR99HTS代码:8542.32.00.71
风险等级:5.82最长访问时间:80 ns
I/O 类型:COMMONJESD-30 代码:R-PDIP-T28
JESD-609代码:e3长度:37.085 mm
内存密度:262144 bit内存集成电路类型:OTP ROM
内存宽度:8功能数量:1
端子数量:28字数:32768 words
字数代码:32000工作模式:ASYNCHRONOUS
最高工作温度:85 °C最低工作温度:-40 °C
组织:32KX8输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:DIP
封装等效代码:DIP28,.6封装形状:RECTANGULAR
封装形式:IN-LINE并行/串行:PARALLEL
峰值回流温度(摄氏度):NOT SPECIFIED电源:5 V
编程电压:12.75 V认证状态:Not Qualified
座面最大高度:5.08 mm最大待机电流:0.0001 A
子类别:OTP ROMs最大压摆率:0.03 mA
最大供电电压 (Vsup):5.25 V最小供电电压 (Vsup):4.75 V
标称供电电压 (Vsup):5 V表面贴装:NO
技术:CMOS温度等级:INDUSTRIAL
端子面层:Matte Tin (Sn)端子形式:THROUGH-HOLE
端子节距:2.54 mm端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:15.24 mm
Base Number Matches:1

M27C256B-80XB6X 数据手册

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M27C256B  
(1)  
Table 8B. Read Mode AC Characteristics  
(T = 0 to 70°C, –40 to 85°C, –40 to 105°C or –40 to 125°C; V = 5V ± 5% or 5V ± 10%; V = V  
)
A
CC  
PP  
CC  
M27C256B  
-10 -12  
Min Max Min Max Min Max Min Max  
Symbol  
Alt  
Parameter  
Test Condition  
-90  
-15/-20/-25 Unit  
Address Valid to  
Output Valid  
t
t
E = V , G = V  
90  
90  
40  
30  
30  
100  
100  
50  
120  
120  
60  
150  
150  
65  
ns  
ns  
ns  
ns  
ns  
ns  
AVQV  
ACC  
IL  
IL  
Chip Enable Low to  
Output Valid  
t
t
G = V  
ELQV  
CE  
IL  
IL  
IL  
IL  
Output Enable Low to  
Output Valid  
t
t
E = V  
G = V  
E = V  
GLQV  
OE  
Chip Enable High to  
Output Hi-Z  
(2)  
t
0
0
0
0
0
0
30  
0
0
0
40  
0
0
0
50  
t
DF  
EHQZ  
Output Enable High  
to Output Hi-Z  
(2)  
t
30  
40  
50  
t
DF  
GHQZ  
Address Transition to  
Output Transition  
t
t
E = V , G = V  
IL IL  
AXQX  
OH  
Note: 1. V must be applied simultaneously with or before V and removed simultaneously or after V .  
PP  
CC  
PP  
2. Sampled only, not 100% tested.  
Figure 5. Read Mode AC Waveforms  
VALID  
tGLQV  
VALID  
A0-A14  
tAVQV  
tAXQX  
E
tEHQZ  
tGHQZ  
G
tELQV  
Hi-Z  
Q0-Q7  
AI00758B  
System Considerations  
The power switching characteristics of Advance  
CMOS EPROMs require careful decoupling of the  
output control and by properly selected decoupling  
capacitors. It is recommended that a 0.1µF ceram-  
ic capacitor be used on every device between V  
CC  
devices. The supply current, I , has three seg-  
and V . This should be a high frequency capaci-  
CC  
SS  
ments that are of interest to the system designer:  
the standby current level, the active current level,  
and transient current peaks that are produced by  
the falling and rising edges of E. The magnitude of  
this transient current peaks is dependent on the  
capacitive and inductive loading of the device at  
the output. The associated transient voltage peaks  
can be suppressed by complying with the two line  
tor of low inherent inductance and should be  
placed as close to the device as possible. In addi-  
tion, a 4.7µF bulk electrolytic capacitor should be  
used between V and V for every eight devic-  
CC  
SS  
es. The bulk capacitor should be located near the  
power supply connection point. The purpose of the  
bulk capacitor is to overcome the voltage drop  
caused by the inductive effects of PCB traces.  
6/16  

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