Reference Only
Spec No. JELF243B-0003S-01
P.2/10
6. Electrical Performance
No.
Item
Specification
Test Method
6.1 Inductance
Inductance shall meet item 3.
Measuring Equipment:
KEYSIGHT 4291A or equivalent (1mA)
Measuring Frequency:
6.2
Q
Q shall meet item 3.
50MHz / 47nH to 82nH
25MHz / 100nH to 820nH
10MHz / 1.0µH to 2.2µH
6.3 DC
Resistance
DC Resistance shall meet item 3.
Measuring Equipment: Digital multi meter
Digital multi meter
(TR6846 or equivalent)
a
terminal1
terminal2
SW
b
DC resistance shall be measured after
putting chip coil between the terminal 2
under the condition of opening between
a and b.
Every measurement the terminal 1 shall
be shorted between a and b when
changing chip coil.
6.4 Self Resonant
Frequency (S.R.F)
6.5 Rated Current
S.R.F shall meet item 3.
Measuring Equipment:
Agilent 4291A or equivalent (1mA)
The rated current is applied.
Self temperature rise shall be
limited to 25°C max.
Inductance Change: within ±10%
7. Mechanical Performance
No.
Item
Specification
Chip coil shall not be damaged after
tested as follows.
Test Method
7.1 Shear Test
Applied Direction
Chip Coil
F
Substrate
Force: 10N
Hold Duration: 5s±1s
Applied Direction: Parallel to PCB
Substrate: Glass-epoxy substrate
7.2 Bending Test
Chip coil shall not be damaged after
tested as follows.
(100mm×40mm×1.6mm)
Pressure jig
R340
F
Deflection
Product
45
45
(in mm)
Speed of Applying Force: 1mm / s
Deflection: 2mm
Hold Duration: 30 s
7.3 Vibration
Appearance: No damage
Oscillation Frequency :
Inductance Change: within ±10%
10Hz to 55Hz to 10Hz for 1 min
Total Amplitude: 1.5mm
Testing Time:
A period of 2 h in each of 3 mutually
perpendicular directions.
MURATA MFG.CO., LTD