LME49720
www.ti.com
SNAS393C –MARCH 2007–REVISED APRIL 2013
LME49720 Dual High Performance, High Fidelity Audio Operational Amplifier
Check for Samples: LME49720
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FEATURES
KEY SPECIFICATIONS
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Easily Drives 600Ω Loads
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Power Supply Voltage Range: ±2.5 to ±17V
THD+N (AV = 1, VOUT = 3VRMS, fIN = 1kHz):
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Optimized for Superior Audio Signal Fidelity
Output Short Circuit Protection
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RL = 2kΩ: 0.00003% (typ)
RL = 600Ω: 0.00003% (typ)
PSRR and CMRR Exceed 120dB (typ)
SOIC, PDIP, TO-99 Metal Can Packages
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Input Noise Density: 2.7nV/√Hz (typ)
Slew Rate: ±20V/μs (typ)
APPLICATIONS
Gain Bandwidth Product: 55MHz (typ)
Open Loop Gain (RL = 600Ω): 140dB (typ)
Input Bias Current: 10nA (typ)
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Ultra High Quality Audio Amplification
High Fidelity Preamplifiers
High Fidelity Multimedia
Input Offset Voltage: 0.1mV (typ)
DC Gain Linearity Error: 0.000009%
State of the Art Phono Pre Amps
High Performance Professional Audio
DESCRIPTION
High Fidelity Equalization and Crossover
Networks
The LME49720 is part of the ultra-low distortion, low
noise, high slew rate operational amplifier series
optimized and fully specified for high performance,
high fidelity applications. Combining advanced
leading-edge process technology with state-of-the-art
circuit design, the LME49720 audio operational
amplifiers deliver superior audio signal amplification
for outstanding audio performance. The LME49720
combines extremely low voltage noise density
(2.7nV/√Hz) with vanishingly low THD+N (0.00003%)
to easily satisfy the most demanding audio
applications.
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High Performance Line Drivers
High Performance Line Receivers
High Fidelity Active Filters
TYPICAL APPLICATION
150W
3320W
3320W
150W
26.1 kW
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909W
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LME49720
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LME49720
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3.83 kW
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100W
OUTPUT
22 nF//4.7 nF//500 pF
10 pF
INPUT
47 kW
47 nF//33 nF
Note: 1% metal film resistors, 5% polypropylene capacitors
Figure 1. Passively Equalized RIAA Phono Preamplifier
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2007–2013, Texas Instruments Incorporated