LM833
www.ti.com
SLOS481A –JULY 2010–REVISED AUGUST 2010
DUAL HIGH-SPEED AUDIO OPERATIONAL AMPLIFIER
Check for Samples: LM833
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FEATURES
APPLICATIONS
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HiFi Audio System Equipment
Preamplification and Filtering
Set Top Box
Microphone PreAmplifier Circuit
General-Purpose Amplifier Applications
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Dual-Supply Operation: ±5 V to ±18 V
Low Noise Voltage: 4.5 nV/√Hz
Low Input Offset Voltage: 0.15 mV
Low Total Harmonic Distortion: 0.002%
High Slew Rate: 7 V/ms
High-Gain Bandwidth Product: 16 MHz
High Open-Loop AC Gain: 800 at 20 kHz
Large Output-Voltage Swing: 14.1 V to –14.6 V
Excellent Gain and Phase Margins
Available in 8-Pin MSOP Package (3mm x
4.9mm x 0.65mm)
D (SOIC), DGK (MSOP), OR P (PDIP) PACKAGE
(TOP VIEW)
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OUT1
IN1–
IN1+
VCC–
VCC+
OUT2
IN2–
IN2+
DESCRIPTION
The LM833 is a dual operational amplifier with high-performance specifications for use in quality audio and
data-signal applications. This device operates over a wide range of single- and dual-supply voltage with low
noise, high-gain bandwidth, and high slew rate. Additional features include low total harmonic distortion, excellent
phase and gain margins, large output voltage swing with no deadband crossover distortions, and symmetrical
sink/source performance.
The dual amplifiers are utilized widely in circuit of audio optimized for all preamp and high level stages in PCM
and HiFi systems. LM833 is pin-for-pin compatible with industry-standard dual operation amplifiers' pin
assignments. With addition of a preamplifier, the gain of the power stage can be greatly reduced to improve
performance.
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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2010, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.